二手 HITACHI S-9300 #9032647 待售
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已售出
ID: 9032647
優質的: 2001
CD Scanning electron microscope, 8-12"
Electron optical system:
Electron gun: SCHOTTKY Emission source
Electro magnetic lens:
3-Stage electromagnetic lens system with boosting voltage
Objective lens: (4) Openings click stop
Heated aperture is selectable / Adjustable outside the vacuum
Scan coil:
2-Stage electromagnetic deflection
Astigmatism correction via an 8-pole electromagnetic coil
Magnification: 1000x to > 300000x
Field control method: Continuously on for sample discharging at all voltages
Wafer imaging ability; Entire surface of 8” (or 12”) wafer
Depth of focus: >= 1.0 um at 80000x magnification
Resolution: 3 nm (800V) Retarding / Boosting mode
Hitachi probe tip
Power: 208 V 60 Hz 6 kVA 1 Phase
CD Measurement principle: Cursor and line profile measurement
Optical microscope system:
Image is monochrome
CCD Camera
Magnification is 110x
Wafer imaging:
X Coverage from 5 – 295 mm
Y Coverage from 5 – 195 mm
Notch down
Field of view: 1.2 mm
Accelerating voltage: 500 V to 1600 V, 10 V steps
Probe current: 4~24pA
Workstation:
Model: HP B180L (9GB)
O/S: Unix version HP-UX 10.20
Software version: 14.71
SECS / GEM Communication interface
Dual XY HITACHI micro scale
DSP Image processing
BSE Mode functionality
Multipoint measurement function
Edge roughness function
Automated image archiving function
Wafer handling system: (2) Cassette holders / ergo flippers
Convertible to 300 mm with conversion kit BRK-287006300
Water chiller unit
Main unit:
HV Controller
Lens PS unit
DEF PS Unit
Laser receiver unit
X-Axis laser unit
Laser linear scale cover
X-Axis excel precision PCB
Y-Axis excel precision PCB
STSensor PCB (R)
STSensor PCB (R)
STSensor PCB (L)
Secondary electron detection: SE and BSE electrons
Aperture ass'y
Ion pump 1, Ion pump 2, Ion pump 3 & controller
TMP1, TMP2 & controller
Stage controller
Display Unit:
Display of SEM and OM images, GUI operation screen
HP Workstation (B180L)
Keyboard & Mouse
FDD
MO Disk drive
System controller
ECPU 263 Controller
C-820A Controller
4500 COGNEX Controller
NMEN Controller
SIP Controller
PSDISP Controller
NSGVA Controller
EOCONT Controller
NOMAFC Controller
STAGE EBSI100 Controller
WT EBSI100 Controller
EVAC EBSI100 Controller
HV EBSI100 Controller
AMHSIO Controller
Power unit:
NIP Board
PS CN PCB
UPS Unit
Main power switch unit
ION pump power supply unit
Power distribution unit
Transformer unit
Port 1:
Door case
EFEM Unit:
Robot ass'y
Ceramic arm
Prealigner
Includes:
Load port 1
Load port 2
WT Controller
Chiller
Option:
Dry pump
Missing parts:
Display unit:
SIP Board
Cognex 4500 board
LAN HUB unit
HDD
Currently de-installed
2001 vintage.
HITACHI S-9300是一種掃描電子顯微鏡(SEM),設計用於材料分析領域的高級應用。它提供了多種成像功能,包括高放大倍率、卓越的分辨率以及各種制作圖像的方法。HITACHI S9300的電子柱能夠以2.5nm的分辨率實現高達570,000 ×的天文放大倍數,從而可以深入了解傳統光學顯微鏡無法到達的區域。因此,它能夠以極高的清晰度對大小結構進行成像,非常適合進行微觀分析。顯微鏡上裝有六硼化的LaB6場發射槍(FEG)和以CS為中心的肖特基場發射槍(FE),但允許在更高放大倍率下有更高的性能。此外,它的多焦點設置允許用戶在保持固定焦點的同時在任意兩個放大倍數之間切換。SEM還擁有一整套探測器,包括二次電子探測器、場發射掃描電子探測器、能量色散X射線探測器、波長色散X射線探測器、單色X射線探測器和X射線熒光探測器。這種種類繁多的探測器使用戶能夠更容易地從他們正在檢查的任何材料中獲取數據。此外,SEM具有多種預編程成像模式,如反向散射電子成像(BSE)、加速電壓對比度成像(AVM)、反射電子成像(REI)以及幾種成像斷層掃描模式。總體而言,S 9300能夠以高放大倍數生成令人難以置信的詳細材料圖像,同時還具有多種探測器和成像模式。它的特點和功能使它成為任何希望調查材料內部運作情況的人的寶貴工具。
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