二手 HITACHI S-9300 #9032647 待售

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製造商
HITACHI
模型
S-9300
ID: 9032647
優質的: 2001
CD Scanning electron microscope, 8-12" Electron optical system: Electron gun: SCHOTTKY Emission source Electro magnetic lens: 3-Stage electromagnetic lens system with boosting voltage Objective lens: (4) Openings click stop Heated aperture is selectable / Adjustable outside the vacuum Scan coil: 2-Stage electromagnetic deflection Astigmatism correction via an 8-pole electromagnetic coil Magnification: 1000x to > 300000x Field control method: Continuously on for sample discharging at all voltages Wafer imaging ability; Entire surface of 8” (or 12”) wafer Depth of focus: >= 1.0 um at 80000x magnification Resolution: 3 nm (800V) Retarding / Boosting mode Hitachi probe tip Power: 208 V 60 Hz 6 kVA 1 Phase CD Measurement principle: Cursor and line profile measurement Optical microscope system: Image is monochrome CCD Camera Magnification is 110x Wafer imaging: X Coverage from 5 – 295 mm Y Coverage from 5 – 195 mm Notch down Field of view: 1.2 mm Accelerating voltage: 500 V to 1600 V, 10 V steps Probe current: 4~24pA Workstation: Model: HP B180L (9GB) O/S: Unix version HP-UX 10.20 Software version: 14.71 SECS / GEM Communication interface Dual XY HITACHI micro scale DSP Image processing BSE Mode functionality Multipoint measurement function Edge roughness function Automated image archiving function Wafer handling system: (2) Cassette holders / ergo flippers Convertible to 300 mm with conversion kit BRK-287006300 Water chiller unit Main unit: HV Controller Lens PS unit DEF PS Unit Laser receiver unit X-Axis laser unit Laser linear scale cover X-Axis excel precision PCB Y-Axis excel precision PCB STSensor PCB (R) STSensor PCB (R) STSensor PCB (L) Secondary electron detection: SE and BSE electrons Aperture ass'y Ion pump 1, Ion pump 2, Ion pump 3 & controller TMP1, TMP2 & controller Stage controller Display Unit: Display of SEM and OM images, GUI operation screen HP Workstation (B180L) Keyboard & Mouse FDD MO Disk drive System controller ECPU 263 Controller C-820A Controller 4500 COGNEX Controller NMEN Controller SIP Controller PSDISP Controller NSGVA Controller EOCONT Controller NOMAFC Controller STAGE EBSI100 Controller WT EBSI100 Controller EVAC EBSI100 Controller HV EBSI100 Controller AMHSIO Controller Power unit: NIP Board PS CN PCB UPS Unit Main power switch unit ION pump power supply unit Power distribution unit Transformer unit Port 1: Door case EFEM Unit: Robot ass'y Ceramic arm Prealigner Includes: Load port 1 Load port 2 WT Controller Chiller Option: Dry pump Missing parts: Display unit: SIP Board Cognex 4500 board LAN HUB unit HDD Currently de-installed 2001 vintage.
HITACHI S-9300是一種掃描電子顯微鏡(SEM),設計用於材料分析領域的高級應用。它提供了多種成像功能,包括高放大倍率、卓越的分辨率以及各種制作圖像的方法。HITACHI S9300的電子柱能夠以2.5nm的分辨率實現高達570,000 ×的天文放大倍數,從而可以深入了解傳統光學顯微鏡無法到達的區域。因此,它能夠以極高的清晰度對大小結構進行成像,非常適合進行微觀分析。顯微鏡上裝有六硼化的LaB6場發射槍(FEG)和以CS為中心的肖特基場發射槍(FE),但允許在更高放大倍率下有更高的性能。此外,它的多焦點設置允許用戶在保持固定焦點的同時在任意兩個放大倍數之間切換。SEM還擁有一整套探測器,包括二次電子探測器、場發射掃描電子探測器、能量色散X射線探測器、波長色散X射線探測器、單色X射線探測器和X射線熒光探測器。這種種類繁多的探測器使用戶能夠更容易地從他們正在檢查的任何材料中獲取數據。此外,SEM具有多種預編程成像模式,如反向散射電子成像(BSE)、加速電壓對比度成像(AVM)、反射電子成像(REI)以及幾種成像斷層掃描模式。總體而言,S 9300能夠以高放大倍數生成令人難以置信的詳細材料圖像,同時還具有多種探測器和成像模式。它的特點和功能使它成為任何希望調查材料內部運作情況的人的寶貴工具。
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