二手 SPTS Sigma FxP #9058880 待售
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ID: 9058880
晶圓大小: 6"
PVD System, 6"
Aluminum, Ti, TiN deposition
8-Port Transport Module configured as follows:
• 150 mm wafer size
• Two Vacuum Cassette Elevators (VCE)
• Transfer Chamber with high throughput Magnatran 7B Robot
• Inligner for wafer pre-alignment
• Cooldown Station for post-process wafer cooling
• Pfeiffer TPH260 turbo pump for each VCE
• CTI Onboard 8 Cryo Pump for Transfer Chamber
Hot Soft etch (HSE) module (1):
Inductively Coupled Plasma (ICP) module for wafer heating and/or surface preparation configured with:
• Coil RF driven by AE RFX600A generator
• Platen RF bias driven by AE RFX600A generator
• Phase-locked matching
• High temperature platen
o Resistively heated
o Set temperature range 80 to 600 °C
o PID temperature controller with ±10 °C accuracy
• Gas lines
o 50 sccm MKS MFC for Ar (process)
o 300 sccm MKS MFC for Ar (backfill heat)
• Vacuum system
o CTI Onboard 8F Enhanced Cryo Pump
o MKS 50mT and 10 Torr full range Baratrons
o Inficon BAG100S Ion Gauge
o Two-position gate valve. Process chamber pressure is defined by
gas flows
Standard Aluminium deposition module (2):
DC planar magnetron sputter module for thick aluminium deposition configured with:
• 45 mm fixed target to wafer spacing
• Swept-field magnetron
• AE Pinnacle 30 kW DC Target PSU
• Praxair Al (1%Si) monoblock UFG Target fitted for standard Trikon process acceptance testing
• High temperature standard platen
o Resistively heated
o Set temperature range 50 to 400 °C
o PID temperature controller with ±10 °C accuracy
o Enhanced air cooling for thick film depositions
• Gas lines
o 100 sccm MKS MFC for Ar (process)
• Vacuum system
o CTI Onboard 8F Enhanced Cryo Pump
o MKS 50 mT and 10 T full-range Baratron gauges
o Inficon BAG100S ion gauge
o Two-position gate valve. Gas flows define process pressure.
Standard Aluminium/Ti/TiN/TiW deposition module (1):
DC planar magnetron sputter module for aluminium deposition configured also to deposit titanium, titanium nitride or titanium tungsten.
• 45 mm fixed target to wafer spacing
• Swept-field magnetron
• Slow magnetron motor for Cu-backed target operation
• AE Pinnacle 30 kW DC Target PSU
• Praxair Al (1%Si) monoblock UFG Target fitted for standard Trikon process acceptance testing
• Shutter for in-situ target cleaning
• High temperature standard platen
o Resistively heated
o Set temperature range 50 to 400 °C
o PID temperature controller with ±10 °C accuracy
o Enhanced air cooling for thick film depositions
• Platen RF bias driven by AE RFX600A generator
• Gas lines
o 300 sccm MKS MFC for Ar (process)
o 100 sccm MKS MFC for N2 (process)
• MKS Microvision IP RGA
• Vacuum system
o CTI Onboard 8F Enhanced Cryo Pump
o MKS 50mT and 10 Torr full range Baratrons
o Inficon BAG100S ion gauge
o Two-position gate valve. Gas flows define process pressure.
Cluster tool controller (CTC) and datalogging PC:
• 1 GHz Dual Pentium III with 1 Gb RAM
• 40 Gb SCSI hard drive, 3.5 inch 1.44 Mb floppy, Zip, CD ROM
• TCP/IP comms to Module Controllers
Module controllers:
• PC104-based
• Geode 300MHz with 256 Mb RAM
• Windows embedded OS with Compact Flash storage
Operator interface:
• High resolution colour touchscreen, with membrane keyboard in clean room interface panel
• Maintenance keyboard and touchscreen in grey area. System and module mimic and status displays
• Password access control to user-defined security levels
• High and low-level control of individual devices subject to interlocks and level of security access
Recipe programming:
• Multi-step, multi-chamber recipes possible, with serial, parallel and recursive wafer sequencing
• Recipe entries prompted and checked
Event monitoring:
• Alarms and events displayed and logged
• Light tower displays system status.
• Lot and wafer tracking supported
• Process and machine parameters monitored and displays continuously updated
• Process data logged to disk
Data logging:
• Captures measured values every second
• Stored by wafer number/batch id/process step
• Data displayed on GUI or can be exported to remote PC in .CSV file format for data manipulation
Operating system/software:
• Cluster Tool and Module Controllers run Windows OS
• High-level software in C++
Host computer interface:
• Fully SECS II/GEM compliant via HSMS
The system is CE marked, conforming to the following standards:
• Machine Directive 98/37/EC
• EMC Directive 89/336/EEC
• Low voltage Directive 73/23/EEC
2005 vintage.
SPTS Sigma FxP 蝕刻器/asher是一種高吞吐量、高級蝕刻和灰化解決方案,專為低成本的25 nm以下工藝節點制造而設計。它在單個集成系統中提供原位高分辨率成像、高通量處理、反應性離子蝕刻(RIE)和原子層沈積(ALD)功能。該平臺旨在滿足當今領先的消費電子制造商的先進包裝要求。Sigma FxP的高級蝕刻和灰化解決方案對於涉及薄膜沈積、圖樣化和晶圓平面化的過程特別有利。它提供了一個易於使用的平臺,與傳統技術相比,以較小的剩余殘留物和較少的工藝步驟,在單個步驟中將多層蝕刻到基板上。SPTS Sigma FxP具有先進的導航模塊和過程控制器,以及高度先進的集成真空系統。它對工藝參數的高精度、實時監控和控制比傳統的蝕刻或灰化工藝能提供更高的精度。實時數據也可用於流程優化。為了適應光刻工藝,Sigma FxP實現了設備功能的直接成像,從而改進了工藝控制和反饋。先進的光學器件允許比大多數其他蝕刻和灰化系統更高的分辨率,也可以提供更精確的3D微觀結構表征。SPTS Sigma FxP平臺還提供高級自動化功能,以減少用戶在處理過程中的幹預。兩個獲得專利的精密定位系統為工藝頭提供了可重復和準確的移動,以提高對準精度,同時還提供了精密的負載鎖定和負載端口操作,以提高吞吐量。Sigma FxP還通過其先進的基板處理系統提供了更大的靈活性。這允許用戶將其基材從一個加工站移動到另一個加工站,而不會造成任何損壞或過程汙染的風險。SPTS Sigma FxP專為高通量和高質量性能而設計。它提供實時的過程監控、控制和優化,從而實現比其他類似系統更高的盈利能力。其先進的成像和自動化功能在過程時間和能耗方面可節省成本。Sigma FxP非常可靠,平均故障間隔時間大於200,000小時。這使得它非常適合高級25 nm以下進程節點項目中的應用程序。
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