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675 結果發現: 用 X-ray

  • AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT: 5DX (5300) SERIES 2L

    in-line 3D X-ray machines Bar codereader Multi-link workstation Max board size: 457x609mm 2000 vintage.
  • PHILIPS SPW-1830

    PHILIPS: SPW-1830

    X-ray generator.
  • RIGAKU 3640 XRF

    RIGAKU: 3640 XRF

    Wafer / Disk analyzer, 6"-8" 5 Standard elements for measuring: Ti, TiW(90/10), Au, TiW/Au (layer 1 TiW & layer 2 Au), Ti/Au(layer 1 Ti & layer 2 Au) Each correlation parts with (3) different thickness for measurement check Applied to semiconductor / drive IC front end process of bumping Configuration: Main body: Measuring stage with vacuum function by X-ray Main column and chamber Single chamber only Manual wafer transfer robot unit Display unit: Monitor shows statistic character on monitor Power transformer BOC EDWARDS IL70 dry pump Chiller: Yes Utilities: CDA N2 PCW Main M/C Holders, 6"-8" X-Ray tube Ti Goniometer Scanning goniometer Heat exchanger High voltage transformer Automatic voltage regulation Manual L/UL Control and vision system: Control system: PC Based with RS232 port Operation man-machine interface: Color touch panel, 18" Data collection: yes Facility and environment: Operation temperature: 15-25°C Relative humility: ≤75% N-2 for dry pump: Flow rate: 10 mL/min Pressure: 0.3~0.7 MPa (3~7kg/cm-2) Cooling water for heat exchange: Temperature: ≤ 30 °C Pressure: 0.2~0.4 MPa (2~4kg/cm2) Quality: City water Cooling water for dry pump: Flow rate: 3.5 L/min Temperature: ≤30°C Pressure: 0.2~0.4 MPa (2~4kg/cm2) Quality: City water (2) Operation manuals Installation instruction System module introduction Operation instructions Safety instructions (2) Repair and maintenance manuals PM Instructions Trouble shooting instructions Circuit diagram 208 VAC, 60 Hz, 3 Phase, 80A Currently warehoused 2003 vintage.
  • VEECO: XRF-300 AT

    X-Ray Flourescence System Collimators: 2, 4, 8, 12, 20, 25 mil Applications: Single, Double and thickness & composition measurements Solution Analysis Auto Calibration Manual and Auto Measurement X-ray tube options vary, Mo target Be window, W target glass 50kv, 1ma capability Sample viewing, Color CCD camera Stage: Programmable X, Y, Z, stepper Single and dual filters, numerical filtering.
  • SCINTAG XDS 2000

    SCINTAG: XDS 2000

    X-Ray Difractometer Includes: 2 Theta Goniometer Spellman DF 3 Generator Scintillation Detector Ortec Counting Electronics 8K Microprocessor.
  • FEINFOCUS FVX 400.23

    FEINFOCUS: FVX 400.23

    X-Ray Power Supply Block Typ: MSU 2420/05 5000VA, 50/60HZ 1997 vintage.
  • FISCHER FISCHERSCOPE BETA 870C

    FISCHER: FISCHERSCOPE BETA 870C

    backscatter coating and plating thickness measurement instrument, stand, and source holders (not the sources), does not include probe.
  • GLENBROOK TECHNOLOGIES: JEWEL BOX 70-T

    Real time X-ray inspection system Includes 70 kv, 10 micron focal spot x-ray tube for ultra high resolution inspection Up to 500x geometric and 1,200x optical magnification X-Y-Z movement with 360 degree rotation and 45 degree tilt New GTI-60 Image Processing Software with 2-64 frame averaging and image download PC and monitor not included.
  • GLENBROOK TECHNOLOGIES RTX-113

    GLENBROOK TECHNOLOGIES: RTX-113

    X-ray machine Tube: 80 kV, 35 micron focal spot PC controlled Zoom lens camera with 4x - 50x magnification Motorized X-Y positioner GTI-1000 image processing software with 2-256 frame averaging, X-Y measurement, AVI video recording and image download 2011 vintage.
  • RIGAKU: 3100

    XRF system Sample changer with (150) cassettes Includes computer and software Tube installed in 2011 De-installed in 2012 Parts that need to be replaced: Gonio (2) Vacuum pumps 1998 vintage.
  • HITEX MFX-II

    HITEX: MFX-II

    X-ray machine Tube current: 5 mA 220 V, 150 KVP 1990 vintage.
  • HEWLETT-PACKARD: FAXITRON

    X-ray machine Mounted on table.
  • SEC: SF 160

    X-ray inspection system.
  • LEYBOLD 865920

    LEYBOLD: 865920

    Emission regulation X-ray source.
  • RIGAKU TXRF 3750

    RIGAKU: TXRF 3750

    X-Ray fluorescence system With rotating anode target Helium compressor: CNA-21 Chiller: LN2-DIW X-Ray generator Power box Sweeping mode on wafer: Yes W-M and W-Lb: 15 mm From edge H.E.: 25 mm From edge SSD Equipped Spectrum: Failure 2007 vintage.
  • SIEMENS POWDER

    SIEMENS: POWDER

    XRD System Includes: Detector X,Y,Z Stage Controller card.
  • RIGAKU 3640 XRF

    RIGAKU: 3640 XRF

    Wafer / Disk analyzer Without handler 1998 vintage.
  • OXFORD CMI

    OXFORD: CMI

    X-ray system.
  • HEIMANN: PS3010

    Scanning system 125 V.
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