二手 ADVANTEST T 5335P #135567 待售
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ID: 135567
優質的: 1997
Memory test systems
Configuration:
CONFIGURATION OF TEST HEAD
NUMBER OF TEST HEAD [1,2] ...........................> 2
CONFIGURATION OF TEST HEAD 1
TEST HEAD TYPE
1.650CH
2.1300CH [1,2] .....................> 1
PIN CONFIGURATION SLOT NO. [33,97,41,105]
CHILD A ....> 33,41,97,105
CHILD B ....> 33,41,97,105
CHILD C ....> 33,41,97,105
CHILD D ....> 33,41,97,105
PIN CONFIGURATION OPTION1 PIN CARD [Y,N]
CHILD A ....> YES
CHILD B ....> YES
CHILD C ....> YES
CHILD D ....> YES
PIN CONFIGURATION OPTION2 PIN CARD [Y,N]
CHILD AB ...> YES
CHILD CD ...> YES
BYPASS CAPACITOR TO 10V/16V PPS (PCON)
1.NON-EXISTENT
2. EXISTENT [1,2] ..............> 1
BYPASS CAPACITOR TO HV PPS (PCON)
1.NON-EXISTENT
2. EXISTENT [1,2] ..............> 1
CONFIGURATION OF TEST HEAD 2
TEST HEAD TYPE
1.650CH
2.1300CH [1,2] .....................> 1
PIN CONFIGURATION SLOT NO. [33,97,41,105]
CHILD A ....> 33,41,97,105
CHILD B ....> 33,41,97,105
CHILD C ....> 33,41,97,105
CHILD D ....> 33,41,97,105
PIN CONFIGURATION OPTION1 PIN CARD [Y,N]
CHILD A ....> YES
CHILD B ....> YES
CHILD C ....> YES
CHILD D ....> YES
PIN CONFIGURATION OPTION2 PIN CARD [Y,N]
CHILD AB ...> YES
CHILD CD ...> YES
BYPASS CAPACITOR TO 10V/16V PPS (PCON)
1.NON-EXISTENT
2. EXISTENT [1,2] ..............> 1
BYPASS CAPACITOR TO HV PPS (PCON)
1.NON-EXISTENT
2. EXISTENT [1,2] ..............> 1
CONFIGURATION OF DPU
1'ST DPU : STN 1,2 [Y,N] ..........................> YES
2'ND DPU : STN 1,2 [Y,N] ..........................> NO
TEST HEAD 1 DC CONFIGURATION [1-16] .............> 1-16
10V PPS CONFIGURATION [1-32] .............> 1-32
16V PPS CONFIGURATION [17-32] ............>
HV PPS CONFIGURATION [1-4] .............>
TEST HEAD 2 DC CONFIGURATION [1-16] .............> 1-16
10V PPS CONFIGURATION [1-32] .............> 1-32
16V PPS CONFIGURATION [17-32] ............>
HV PPS CONFIGURATION [1-4] .............>
1'ST GPIB I/F BOARD
0.NONE
1.BGR-010944X01
2.BGR-010944X02
3.BGR-010944X03
4.BGR-010944X04
5.BGK-012718 [0-5] .........> 0
2'ND GPIB I/F BOARD
0.NONE
1.BGR-016793 (DPU I/F)
2.BGR-010944X05
3.BGK-012718X02 [0-3] .........> 1
DMM TYPE 1.TR6861
2.R6871E
3.R6551
4.R6552T [1-4] .........> 4
AC FREQUENCY (HERTZ) [50,60] ........................> 60
CONFIGURATION OF FM
NUMBER OF FM BOARD [0-4] .........> 4
SIZE OF FM MODULE
1. 1M
2. 4M
3. 8M [1-3] .........> 1
NUMBER OF MEMORY BANK [1-2] .........> 1
NUMBER OF MEMORY BLOCK [1-4] .........> 4
PATTERN MEMORY [Y,N] .........> NO
FM BOARD KIND 1. BGR-020816
2. BGR-020816X02 [1-2] ..............> 2
CONFIGURATION OF MRA
MRA2/3 OPTION [Y,N] ...........................> YES
MRA OPTION TYPE [2,3] (2=MRA2,3=MRA3) ...........> 2
TYPE OF CBU BOARD [1,2] (1: BGR-019267 )
(2: BGR-019267X02) ....> 1
NUMBER OF CBU BOARD [1,2,3,4] .......................> 2
TYPE OF FBM BOARD [1,2,3,4] (1= 4M*36BIT)
(2= 4M*72BIT)
(3= 8M*72BIT)
(4=16M*72BIT) .........> 3
NUMBER OF FBM BOARD [1-4] ...........................> 4
COMPRESSION FUNCTION [Y,N] ...........................> NO
CONFIGURATION OF FCDC
FLASH OPTION [Y,N] ...........................> YES
SC BOARD KIND 1. BGR-020774
2. BGR-020774X02 [1-2] ..............> 1
Currently stored in a warehouse
1997 vintage.
ADVANTEST T 5335P是一種FINAL TEST設備,專為電子、汽車和機器人等各個領域的工程師和專業人員設計。該系統為執行與單元級驗證和調試相關的測試提供高端解決方案。ADVANTEST T5335P提供全面的測試編程能力和綜合測試;多核片上工具(SoC)設備的精確機器測試場景、驗證、調試、分析和優化。它包括一個可編程數字信號處理(DSP)平臺,可以幫助配置模數和數模信號轉換,以創建定制的測試解決方案。此外,還可以通過可編程電源(PPS)為電子設備供電,同時還可以使用示波器獲取詳細的設計數據。高級測試工具,如快速傅立葉變換(FFT)和矢量信號分析器可以幫助配置和優化信號處理,以及模擬和仿真解決方案。T 5335 P也可用於半導體參數測試(SIP)進行參數估計和驗證。此外,此測試資產允許對音頻和視頻測試等應用程序進行信號和時間關聯。測試可以在備用模式和活動模式下進行。最後,T 5335P提供了用於生產運行的調試時間減少,以及具有實時斷點和跟蹤捕獲的高級調試功能。它還配備了數據管理功能,以確保準確高效的硬件和軟件測試。這包括大數據存儲(BDS)選項,能夠存儲各種測試數據,包括波形和定時圖。總體而言,它是一種高級測試模型,具有廣泛的最終測試解決方案。
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