二手 ADVANTEST T 5335P #9178728 待售

製造商
ADVANTEST
模型
T 5335P
ID: 9178728
晶圓大小: 12"
優質的: 1996
Memory tester, 12" System configuration generate Configuration of test head Number of test head [1,2] ...........................>[2] Configuration of test head 1 Test head type 1.650CH 2.1300CH [1,2] .....................> [1] Pin configuration Slot no. [33,97,41,105] Child A ....> [33,41,97,105˙] Child B ....> [33,41,97,105˙] Child C ....> [33,41,97,105˙] Child D ....> [33,41,97,105˙] Pin configuration Option1 PIN CARD [Y,N] Child A ....> [Yes] Child B ....> [Yes] Child C ....> [Yes] Child D ....> [Yes] Pin configuration Option2 Pin card [Y,N] Child AB ...> [Yes] Child CD ...> [Yes] Bypass capacitor to 10V/16V PPS (PCON) 1. Non existent 2. Existent [1,2] ..............> [1] Bypass capacitor to HV PPS (PCON) 1. Non existent 2. Existent [1,2] ..............> [1] Configuration of test head 2 Test head type 1.650CH 2.1300CH [1,2] [1] Pin configuration Slot no. [33,97,41,105] Child A: [33,41,97,105] Child B: [33,41,97,105] Child C: [33,41,97,105] Child D: [33,41,97,105] Pin configuration Option1 pin card [Y,N] Child A [Yes] Child B [Yes] Child C [Yes] Child D [Yes] Pin configuration Option2 pin card [Y,N] Child AB [Yes] Child CD [Yes] Bypass capacitor to 10V/16V PPS (PCON) 1. Non-existent 2. Existent [1,2] [1] Bypass capacitor to HV PPS (PCON) 1. Non-existent 2. Existent [1,2] [1] Configuration of DPU 1'ST DPU : STN 1,2 [Y,N] [Yes] 2'ND DPU : STN 1,2 [Y,N] [Yes] Test head 1 DC Configuration [1-16] [1-16] 10V PPS Configuration [1-32] [1-32] 16V PPS Configuration [17-32] [˙] HV PPS Configuration [1-4] [1-4] Test head 2 DC Configuration [1-16] [1-16] 10V PPS Configuration [1-32] [1-32] 16V PPS Configuration [17-32] [˙] HV PPS Configuration [1-4] [1-4] 1'ST GPIB I/F Board 0.No 1.BGR-010944X01 2.BGR-010944X02 3.BGR-010944X03 4.BGR-010944X04 5.BGK-012718 [0-5] [0] 2'ND GPIB I/F Board 0.No 1.BGR-016793 (DPU I/F) 2.BGR-010944X05 3.BGK-012718X02 [0-3] [1] DMM Type 1. TR6861 2. R6871E 3. R6551 4. R6552T [1-4] [3] AC Frequency (Hertz) [50,60] [60] Configuration of FM Number of FM board [0-4] [2] Size of FM module 1. 1M 2. 4M 3. 8M [1-3] [1] Number of memory bank [1-2] [2] Number of memory bank [1-4] [4] Pattern memory [Y,N] [No] FM Board kind 1. BGR-020816 2. BGR-020816X02 [1-2] [2] Configuration of MRA MRA2/3 Option [Y,N] [Yes] MRA Option type [2,3] (2=MRA2,3=MRA3) [2] Type of CBU Board [1,2] (1: BGR-019267) (2: BGR-019267X02) ....> [1] Number of CBU Board [1,2] [2] Type of FBM Board [1,2,3,4] (1= 2M*72BIT) (2= 4M*72BIT) (3= 8M*72BIT) (4=16M*72BIT) .........> [1] Number of FBM Board [1-4] [4] Compression function [Y,N] [No] Configuration of FCDC Flash option [Y,N] [No] SC Board kind 1. BGR-020774 2. BGR-020774X02 [1-2] [1] End save 1996 vintage.
ADVANTEST T 5335P是一種綜合性的最終測試設備,旨在快速評估當今高密度和復雜集成電路(ICs)的性能。該系統由一個包括IC測試儀、處理程序和各種測試頭在內的儀器平臺組成。該測試儀配備了廣泛的通用和用戶可編程測試程序,使用戶能夠輕松自信地測試各種IC。ADVANTEST T5335P測試儀具有高速數據采集能力,能夠在設置測試時準確分析數據。其無維護、使用壽命長的設計有助於確保即使在高溫和惡劣的環境條件下也具有可靠的性能。其用戶友好的圖形用戶界面允許簡單的操作和編程,並包括各種功能,以實現測試的安全執行。T 5335 P IC測試儀精度高,甚至能檢測到IC中最小的缺陷。它的高密度測試功能使它能夠處理多達1608針的IC。它的自動測試生成功能可以快速構建針對不同IC的測試,從而節省時間和金錢。而且,測試單元帶有內置的安全控制機器,在測試過程中保護IC免受損壞。T5335P工具旨在測試各種IC,包括模擬IC、數字邏輯IC、MCM IC、微控制器、處理器和特定於應用程序的IC。此外,該資產還包括幾個測試頭,這些測試頭旨在捕獲電氣信息並分析IC的每個引腳處的電信號。該模型還提供實時故障診斷,允許用戶在測試過程中快速識別任何問題。此外,ADVANTEST T 5335 P設備提供了廣泛的附加功能,以提高IC測試的效率和準確性。這包括故障模擬和模擬參數測試,以及排序、比較、打印和顯示等數據分析功能。最後,該系統以ADVANTEST可靠的客戶服務為後盾,使T 5335P成為測試高密度和復雜IC的理想選擇。
還沒有評論