二手 ADVANTEST T 5592 #136077 待售

ADVANTEST T 5592
製造商
ADVANTEST
模型
T 5592
ID: 136077
Memory tester with M6751AD handler = /DIAG/G SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.144DR+192I/O 2.288DR+384I/O 3.576DR+768I/O? [1,2,3] ...........> 3 NUMBER OF TEST HEAD? [1,2] ...........................> 2 CONFIGURATION OF TEST HEAD 1 PE1 ( 1 - 6 , 19 , 33 - 38 ,51 , 52 ) CHILD A/B/C/D .....> YES PE2 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD A/B/C/D .....> YES PE3 ( 13 - 18 , 21 , 45 - 50 , 55 , 56 ) CHILD A/B/C/D .....> YES PE4 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD A/B/C/D .....> YES PE5 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD A/B/C/D .....> YES PE6 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD A/B/C/D .....> YES PE7 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD A/B/C/D .....> YES PE8 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD A/B/C/D .....> YES PE9 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD A/B/C/D .....> YES PE10 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD A/B/C/D .....> YES PE11 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD A/B/C/D .....> YES PE12 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD A/B/C/D .....> YES PE13 ( 1 - 6 , 19 , 33 - 38 , 51 , 52 ) CHILD E/F/G/H .....> YES PE14 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD E/F/G/H .....> YES PE15 ( 13 - 18 , 21 , 45 -50 , 55 , 56 ) CHILD E/F/G/H .....> YES PE16 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD E/F/G/H .....> YES PE17 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD E/F/G/H .....> YES PE18 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD E/F/G/H .....> YES PE19 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD E/F/G/H .....> YES PE20 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD E/F/G/H .....> YES PE21 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD E/F/G/H .....> YES PE22 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD E/F/G/H .....> YES PE23 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD E/F/G/H .....> YES PE24 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD E/F/G/H .....> YES CONFIGURATION OF TEST HEAD 2 PE1 ( 1 - 6 , 19 , 33 - 38 , 51 , 52 ) CHILD A/B/C/D .....> YES PE2 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD A/B/C/D .....> YES PE3 ( 13 - 18 , 21 , 45 - 50 , 55 , 56 ) CHILD A/B/C/D .....> YES PE4 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD A/B/C/D .....> YES PE5 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD A/B/C/D .....> YES PE6 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD A/B/C/D .....> YES PE7 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD A/B/C/D .....> YES PE8 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD A/B/C/D .....> YES PE9 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD A/B/C/D .....> YES PE10 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD A/B/C/D .....> YES PE11 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD A/B/C/D .....> YES PE12 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD A/B/C/D .....> YES PE13 ( 1 - 6 , 19 , 33 - 38 , 51 , 52 ) CHILD E/F/G/H .....> YES PE14 ( 7 - 12 , 20 , 39 - 44 , 53 , 54 ) CHILD E/F/G/H .....> YES PE15 ( 13 - 18 , 21 , 45 - 50 , 55 , 56 ) CHILD E/F/G/H .....> YES PE16 ( 65 - 70 , 83 , 97 - 102 , 115 , 116 ) CHILD E/F/G/H .....> YES PE17 ( 71 - 76 , 84 , 103 - 108 , 117 , 118 ) CHILD E/F/G/H .....> YES PE18 ( 77 - 82 , 85 , 109 - 114 , 119 , 120 ) CHILD E/F/G/H .....> YES PE19 (129 - 134 , 147 , 161 - 166 , 179 , 180 ) CHILD E/F/G/H .....> YES PE20 (135 - 140 , 148 , 167 - 172 , 181 , 182 ) CHILD E/F/G/H .....> YES PE21 (141 - 146 , 149 , 173 - 178 , 183 , 184 ) CHILD E/F/G/H .....> YES PE22 (193 - 198 , 211 , 225 - 230 , 243 , 244 ) CHILD E/F/G/H .....> YES PE23 (199 - 204 , 212 , 231 - 236 , 245 , 246 ) CHILD E/F/G/H .....> YES PE24 (205 - 210 , 213 , 237 - 242 , 247 , 248 ) CHILD E/F/G/H .....> YES CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32 10V PPS CONFIGURATION [1-128] ......> 1-128 TEST HEAD 2 DC CONFIGURATION [1-32] .............> 1-32 10V PPS CONFIGURATION [1-128] ......> 1-128 AC FREQUENCY (Hz) [50,60] ........................> 60 CONFIGURATION OF ALPG NUMBER OF ALPG [1,2,4] ..............................> 4 ONFIGURATION OF PDS NUMBER OF CYCLE PALETTE? [8,16] ......................> 8 CONFIGURATION OF DBM DBM OPTION EXIST? [Y,N] ..............................> YES SIZE OF DBM BOARD? [1-2] [1:256K? 2:1M] ..............> 2 CONFIGURATION OF FM NUMBER OF FM BOARD? [0,4,8] ..........................> 0 END SAVE = /LOG OFF ADVANsite Software Product Information? 08-APR-2009 08:52:21 System Software : ASX/U-51 Version : 6.00A1 CPU Type : SPARC Product P number Revision [Expected] Date Label Title -------------------------------------------------------------------------------- ASXUBASE PASX51-92**** 2.03 [ ] 01-DEC-1989 ROOT SunOS Release 5.7 ATW51SU PASX51-92**** 6.00A [ ] 28-JAN-2002 ATLW51 ATLworks for T5500 Series DIAG5592SU PASX51-92**** 1.05B [ ] 15-MAY-2002 DG5592 Tester Diagnosis (T5592) ICD51SU PICD51-00**** 1.03 [ ] 02-NOV-2000 ICD51 ICD/U-51 One Line Compiler MPEDIT51SU PMPE51-00**** 1.02 [ ] 02-NOV-2000 MPE51 MPEDIT/U-51 Memory Pattern Editor SYSTEST51SU PASX51-92**** 6.00A1 [ ] 06-MAR-2002 SYST51 ADI/SYS TEST (T5581 Series) TESTUTL51SU PASX51-92**** 6.00A1 [ ] 06-MAR-2002 TUTL51 Tester Utilities (T5581 Series) WBMA51SU PWBM51-00**** 4.01 [ ] 31-JAN-2001 WBMA51 Workbench-M2 for T5500 Series (Analysis Tools) WBMW51SU PWTR51-00**** 4.01 [ ] 08-FEB-2001 WBMW51 Workbench-M2 for T5500 Series (WaveTracer2) XATL51SU PXTL51-00**** 5.04A [ ] 08-MAR-2001 XATL51 XATL/U-51 Cross Compiler.
ADVANTEST T 5592是一種最終測試設備,其設計目的是在各種設備上快速高效地執行各種測試。它支持對各種組件和功能(包括數字邏輯電路和模擬設備)進行精確和自動化的測試。該系統采用高速雙階段測試技術,旨在為需要質量導向性能的產品提供快速、準確的測試。T 5592的核心是其先進的測試技術。該單元采用雙階段測試,以確保更準確的結果。在測試過程的第一階段,機器能夠檢測和分析設備,從而實現詳細的分析和事件響應。第二階段測試涉及一個能夠快速檢測、分析和比較設備的並行架構;這會導致快速的測試和更快的校正。此外,該工具還能夠訪問龐大的組成部分信息數據庫,從而能夠進行進一步的分析和比較。此外,ADVANTEST T 5592還提供了增強的GPRS測試功能,並具有全面的遠程訪問和日誌記錄功能。其GPRS測試功能允許用戶通過多個階段的測試快速準確地測試各種GPRS產品。該資產還通過實時圖形和圖表對結果數據進行全面的可視化,從而全面衡量設備性能。在使用方面,T 5592的雙級測試方便了組件和型號級別的測試,允許性能優化和質量控制。該設備能夠實時訪問和分析設備信息,這使其成為產品開發的理想解決方案,為設備設計和性能提供了寶貴的見解。此外,該系統還可用於電路和功能測試,以確保設備的可靠運行和質量。總體而言,ADVANTEST T 5592是一個高級測試單元,其特性和功能可對多種產品進行精確高效的測試。其雙階段測試、GPRS測試能力和實時數據分析使其成為產品開發和電路測試的理想選擇。這臺機器的性能優化和質量控制功能確保了各種組件和設備的可靠和準確的結果。
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