二手 VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293586981 待售
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ID: 293586981
Atomic Force Microscope (AFM)
TFT, 19"
Vacuum chuck
DTR Torsional resonance mode
VT-103-3K-2 Integrated acoustic / Vibration isolation enclosure
NanoScope IVA SPM Control station:
Quadrex Extender electronics with on-board lock-in amplifier
Q-Control
High-speed DSP and SPM computer interface electronics
(6) Analog-to-digital converters
(4) Digital-to-analog converters
Dual monitor color display resolution: 32-Bit, 2048 x 768 pixels
(3) Scanning axes resolution: 16-Bit
Operating system: Windows XP
CE Compliant
Oscillator reference signal:
Line sync (End-of-line)
Frame sync (End-of-frame)
Quadrex Lock-in
Scanning probe microscope:
Samples: Up to 200 mm diameter and 12 mm thick
Magnetic sample holder included for samples less than 15mm diameter and 6mm thick
TrakScan Laser tracking system
Inspectable area: 120 mm x 100 mm
Stage resolution: 2 µm
Vacuum pump
Silicone vibration pad
Motorized optical focus:
Range: 285x - 1285x
Viewing area: 150 µm - 675 µm
Resolution: 1.5 µm
Computer control LED illuminator
Scanning tunneling
Force modulation (air and fluid)
Tapping mode (fluid) microscopy
Nano indenting / Scratching, scanning thermal microscopy
Scanning capacitance microscopy
Repeatability:
Unidirectional: 3 µm (typical), 10 µm (maximum)
Bidirectional: 4 µm (X-axis) and 6 µm (Y-axis), typical
Dimension Hybrid XYZ SPM Microscope head:
Ultra low noise 3-axis closed loop scanner
Scanner
Horizontal imaging area: 90 µm x 90 µm (Nominal maximum)
Vertical range: 9 µm (Nominal), 8 µm (Nominal minimum) in imaging mode
Tip holder
TrakScan Optical lever position detection system
VT-102 Vibration isolation table:
Base with (4) air suspension columns
Required air pressure: 0.8 bar
Minimum door diameter: 70 cm
Size: 610 mm x 610 mm x 787 mm.
VEECO/DIGITAL INSTRUMENTS DIMENSION 3100是一種高功率、用途廣泛且可靠的掃描電子顯微鏡(SEM)。這種最先進的顯微鏡專為科學和工業研究而設計,用於獲取關於樣品的物理、化學、結構和電氣特性的準確和詳細的圖像和信息。該系統具有能量色散X射線檢測器和改進的可變壓力試樣室。EDX檢測器能夠測量樣品的元素組成,而可變壓力室允許在無需疏散的情況下進行樣品測試,從而提高用戶效率和靈活性。VEECO Dimension 3100具有雙光束和分析SEM模式,為用戶提供了一系列功能和分析選項。雙光束模式包括一個聚焦離子束(FIB)探測器,它允許精確改變樣品結構以及成像埋藏特征。該系統的分析SEM模式提供了精確的結構、構圖和尺寸特征,這要歸功於其先進但用戶友好的成像軟件。該系統還包括令人印象深刻的配件選擇,如反向散射電子(BSE)探測器、低溫靜止系統、納米鏡級和寬距離離子束探測器。這些附件能夠對樣品進行詳細的動態分析和3D成像。DIGITAL INSTRUMENTS Dimension 3100的堅固性和可靠性使其成為從材料研究和質量控制到半導體器件開發等多種應用的理想儀器。Dimension 3100憑借其卓越的成像能力、集成的軟件和多用途的配件,是一款可靠且用戶友好的科學和工業研究工具。
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