二手 DVT SOLUTION Gigaprobe DVT30-1MM #102353 待售

ID: 102353
Hand held probe for TEKTRONIX TDR oscilloscopes 30GHz, Differential & Single-end, 0.25~2mm pitch adjustable Used for: TDR/TDT, S-parameter Features: 30 GHz Bandwidth True Odd Mode 100 ohm Differential Input Impedance Probe can be converted to 50 ohm input impedance TDR Launch Discontinuity <20 mv Fall Time 20 ps or <5 ps Fall Time Degradation Fully Balanced Differential Signals without Ground Contact Adjustable Probe Pitch from 0.25 mm to 2.0 mm Probe Tip diameter 0.254 mm Gold Plated Conductive Diamond non oxidizing probe tips for repeatable TDR measurements Low probing force <10 grams Four probes in one: Use as a 100 ohm, 50 ohm, as a Hand Probe or Mount in a probe articulating arm for hands free probing Full Set of Probe Pitch Calibration Accessories Included Characteristics: Attenuation: 1X Probe Only Bandwidth: 30 GHz TDR Degradation: <5 ps Probe Pitch: 0.25 mm to 2.0 mm (signal tip to signal tip) Connector Type: SMA Measured Reflected TDR Fall Time: 20 ps Impedance: 100  differential, 50  common mode, Max Voltage In: 5.0 V (Note: numeric values shown are typical) Applications: Create - Single Ended, Differential Insertion, Return Loss Sparameters from TDR/ TDT Measurements for determining interconnect bandwidth performance using Tektronix DSA8200 TDR and IConnect® Impedance Testing - Use IConnect for precision impedance analysis of IC Packages, Cables, PCB’s and Backplane Testing Failure Analysis of Device Packages - Locate failure modes.
DVT SOLUTION Gigaprobe DVT30-1MM是一種先進的半導體探測裝置,設計用於在測試和測量半導體材料性能時提供業界領先的精度和速度。該單元包含一系列高精度探針,具有超低噪聲設計,使用戶能夠精確測量來自最小電路的電信號。該設備采用緊湊、符合人體工程學的設計,具有長而穩定的平臺,可進行高效測試。可調節的主軸支架允許輕松定位,以快速訪問和精確定位測試元件,從而實現更快的探測和更好的性能。該平臺還允許快速對準和前部進入設備,這有助於減少來自外部汙染物的汙染。探頭設計用於提供強大而安靜的操作,在數據采集過程中最大程度地減少熱量和噪音。該探頭具有獨立的接地回波特性,用於簡化屏蔽信號探測,並具有內部加熱功能,可確保與精確讀數的高度一致性。可移動的樣品處理臂提供快速的樣品裝卸,創造了一個高效的測試解決方案。Gigaprobe DVT30-1MM還提供四個用戶可選擇的接觸力級別的自動聯系人識別和動態自動參考檢查,確保每個聯系人都經過正確測試。此外,通過基於反饋的電壓極限設置和使用多電壓探頭的自動非接觸式測試,可以最大限度地延長測量周期時間。總體而言,DVT SOLUTION Gigaprobe DVT30-1MM是一款創新、高效且功能強大的處理器,旨在滿足最棘手的半導體測試需求。其先進的特性、可靠的性能和高速的數據采集使其成為尋求可靠和準確的探測解決方案的實驗室和半導體測試專業人員的理想選擇。
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