二手 MICROMANIPULATOR 6200 #85275 待售
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ID: 85275
Wafer probe station, 6"
Includes B&L Micro Zoom optics with (2) objectives, 6" chuck, 6x6" travel, manual movement
Accepts 10 or more magnetic or vacuum based manipulators
1 in. (25.4 mm) thick honeycomb construction for maximum stability
Fine Lift Control
True planar vertical motion, convenient knob control
Resolution: 0.3 micron per degree revolution
Range: 0.5 in. (12.7 mm)
Fast Lift Control
Raises platen and microscope with adjustable microscope lift delay
Range: 1.35 in. (34.3 mm)
Three locking up positions
Resolution: 18:1 reduction (handle:platen)
XY STAGE
Stage Movement
Range of motion 6 in. x 6 in. (152 mm x 152 mm)
Movement and vacuum stage planarity permanently set
at factory
Theta rotation control full 360° with conveniently located
locking knob
Control knobs coaxial X-Y for single hand operation from
either side, located center front
Vacuum Stage
Standard 5 in. (127 mm) diameter with dual tweezer
slots
Gold plated brass for low contact resistance
Flatness t.0005 in. (t 12 microns)
Electrical isolation exceeds 5000 megohms at 500VDC
OPTIONAL SOCKET STAGE
Conversion time vacuum to socket and back to vacuum
stage less than 60 seconds
Accepts P.C. cards with ZIF sockets for probing packaged devices while operating
Locking handle for theta rotation control
MICROSCOPE AND POST
Vertical positioning +1.4 in. ( support)
Vertical motion 0 -1.35 in. (34.3 mm) by platen fast lift
handle or fine control knob with adjustable delay
X-Y translation: 1 in. x 1 in. (25.4 mm x 25.4 mm) with
convenient knob control
Factory planarized X-Y translation
Coarse/fine focus control
Microscope
B&L MicroZoom with 2:1 zoom in body
3 long working distance objectives (2.25X, 8X, 25X)
Quadruple nosepiece accepts optional 50X objective
Trinocular head with camera port, 10X eyepieces
Coaxial illuminator with system mounted transformer and
infinite rheostat control.
MICROMANIPULATOR 6200 Prober是一種高精度儀器,設計用於精確操縱和測量微觀元件。該單元設計用於探測、成像和微電子操作,可用於多種應用。手動和自動功能的結合確保了prober的精度和準確性。Prober提供了業界領先的精密探針系列,這些探針具有高度精確、低後移的特點,並具有廣泛的尖端尺寸和形狀。這種多功能性允許對組件墊和端子進行可靠、準確的探測。這些探針也適用於成像和分析,因為它們可以提供實時數字成像和正在測試的組件分析。探頭還允許自動測試元件,如電路元件、引線和元件,以及編程和元件特性。Prober還具有一系列高級圖像捕獲和分析功能。這包括可用於分析組件和創建3 D圖像的高級視覺軟件。軟件還支持組件分類和操作的自動化組件檢測和識別。它還具有自動元件探測和確定功能。這些功能允許進行準確和可重復的組件測量以及組件的自動測試。6200 Prober專為最大的用戶舒適度而設計,易於使用。它具有直觀的用戶界面和直觀的文檔。它還具有遠程和現場技術援助支持網絡。此外,prober還提供了一個全面的軟件工具庫,包括腳本語言、固件更新和。總體而言,MICROMANIPULATOR 6200 Prober是一種功能強大、可靠且準確的工具,非常適合各種應用和用途。它是一種高精度儀器,設計用於精確操縱和測量微觀元件。它提供了業界領先的精密探針系列,這些探針非常精確,並具有各種尖端尺寸和形狀。Prober還支持高級圖像捕獲和分析功能,並且易於使用。對於那些需要對組件進行可靠、準確和自動化測試的人來說,這是一個理想的選擇。
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