二手 SPEA 4060 S2 #9282914 待售

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製造商
SPEA
模型
4060 S2
ID: 9282914
Flying probe tester With bottom side moving head Working hours: 100 P/N / Description 4060s2M BU500 / 4060s2 Manual loading base unit, (4) top moving heads LCK 230 / Board locking mechanism, automatic lock (12 clamps), automatic width adjustment set YAICT 320FP / Motor for BSMH, for 4060s2 M L2FLY R120 / ICT Instruments unit, dual 4 quadrants DC source ±10V/±100mA, ±50V/±100mA, DVM L2BP R120 / Leonardo OS2 FLY Execution AS 6 / Leonardo OS2 Backplane JCS 10 / Test area extension to 686 x 600 mm (27x23"), top side, BSMH compatible with system setup OPS 450 / Open pin test, junction scan OPS 550 / Open pin test - Electroscan on axis 1 & 4 top OPS 560 / Open pin test - Electroscan on axis 5 bottom side moving head ESV 100 / Open pin test - Electroscan on axis 6 bottom side moving head PRT 60 / Electrical & pneumatic energy saving function DK 115 / Internal graphic printer, 24 lines/sec, USB HLD 11 / Base diagnostic tool for FP s2 PRD USA S2 / Stand for monitor, keyboard and printer MSD 120 / Standard system pre-configuration, for 4060s2 SPS 15 / Motorized sliding door, for 4060 M/SL AUS 10 / System power supply, three phase, 208V, for FPs2 CTI 310 / Auxiliary AC sockets, qty 3, 220V, CE BSMH 261 / Connector tester interface, up to 576 TP, for 4060s2 PKB 400 / Bottom side moving heads, 2 heads, optical alignment module with color camera, for LCK 200 series YASCA 64EC / 2x Linear Z axes for bottom side moving heads, for 4060s2 STO 100 / Analog matrix, 64ch, 4/8rows, 120V, 1A, extendable with digital channels, external connection, test interface, for FPS2 LEO2 GOLD FLY / Resistance short test SSD 20 / Leonardo OS2 Suite Fly - Gold - R1.10 1SM 100 / SPEA dongle for LAN installation OPT 400 / Call center support LTM 100 / Automatic optical inspection, alignment, rotation, presence, optical character verify LTA 100 / Laser test module, Accuracy 0.01mm, Spot Ø 0.07mm.
SPEA 4060 S2是一種自動化的半導體晶圓處理裝置。它旨在滿足集成電路測試和燃燒操作的需要,重點是具有中高密度觸點或精細特征分辨率的IC。4060 S2具有雙軸設計,其晶圓處理臂沿著螺旋槳的長軸移動,接觸臂沿橫向軸移動。這種雙軸系統允許精確定位接觸臂,以確保精確探測。Prober還配備了模式識別能力,允許晶片與接觸臂有效對準。此高級功能允許在不同晶圓大小和形狀之間輕松切換。此外,SPEA 4060 S2還具有集成的通過/故障報告功能,可提高生產線測試的效率。Prober還配備了高級安全功能,以確保過程安全準確地執行,而不會損害整個過程。Prober配備了觸摸安全開關,這意味著用戶可以暫停晶圓運動,以減少接觸錯誤或其他與操作員相關的故障的機會。此外,4060 S2還具有機電安全門,當感應到潛在的接觸時,它會激活。在性能方面,SPEA 4060 S2可以以每個接觸點最高5毫秒的速度執行探測操作。Prober的設計還允許最大4.0mm的峰峰校準精度,使其在測量各個接觸點時具有極好的精度。4060 S2的附加特性包括廣泛的力控制參數,允許使用者調整用來與晶圓接觸的力,以盡量減少對集成電路或晶圓的傷害。總體而言,SPEA 4060 S2是一種用途廣泛、精密的半導體晶圓處理裝置,非常適合中高密度接觸測試。憑借其先進的模式識別、通過/失敗報告功能、安全功能和高性能功能,它是測試和刻錄操作的絕佳選擇。
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