二手 FEI Focused Ion Beam Scanning Electron Microscope (FIB-SEM) #293813920 待售

FEI Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
電子顯微鏡
製造商
FEI
模型
Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
ID: 293813920
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