二手 HITACHI S-4500 #9008633 待售
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ID: 9008633
SEM Cold Field Emission System
Performance:
Secondary electron image resolution: 1.5 nm at 15kv
Magnification: 20x - 500kx
Electron optics:
Electron gun: cold field emmission source
Lens type: electromagnetic
Objective aperture: 4 position externally selectable
Stigmator: octopole electromagnetic
Scanning coil: 2-stage electromagnetic
Sample chamber
Size: type i
Airlock: prepumped, max sample size:50 mm diameter
Stage motion: 5 axis manual x/y: 25 mm, z: 3-28 mm, t: -5deg - +45 deg., r: 360 deg continuous
Draw-out door: max sample size:150 mm dia.
Size: type ii
Airlock: prepumped, max sample size:100 mm or 150 mm diameter
Stage motion: 5 axis manual
X/y: 100mm/50 mm, z: 3-33 mm, t: -5 deg - +60 deg., r: 360 deg continuous
Display system:
Image display: dual 12" monitors
Scanning mode: normal, reduced area , line scan, photo scan, spot position, split screen
Scanning speed: tv, 0.3, 2, 9, 25, 35, 100, 160 320 s/frame vsignal processing:real-time processing, auto-brightness and contrast control, dynamic stigmator, sutofocus, a vframe averaging, frame integration, contrast conversion,
Vacuum system:
Full automatic operation with pneumatic valve control
Ultimate vacuum: 10 (-7) pa in electron gun chamber, 10(-4) pa in specimen chamber
Ion pump: 60 l/s x1, 20 l/s x2
Speciment chamber: dp (570 l/s); turbo optional
Foreline: rotary pump x2
Accessories (optional)
Edx:at 30 deg. Take off angle
Digital image capturing: orion-6 software, optional
Chilled water circulator: 10 - 20 deg c, 1.0 -1.5 l/m for dp only
Installation
Ac: single phase ac 220 or 240 volt, 50/60 hz
Grounding: independent grounding 100 ohms or less.
HITACHI S-4500是一種用於高級材料分析和成像的掃描電子顯微鏡(SEM)。這臺機器能夠達到較高的細節水平,非常適合納米技術和生物科學等領域的分析。HITACHI S 4500有幾個關鍵功能,使其成為一個強大的研發工具。首先,顯微鏡配備了場發射電子源和靜電透鏡系統。該系統提供超高分辨率成像,對於二次電子和反向散射電子成像都小至0.4 nm。此外,S-4500在可變壓力室中運行,這意味著它可以將電子束和樣品室壓力調整到理想水平,同時保持充電效果。這使得它能夠產生更少的偽影和更精確的表面特征的高質量圖像。此外,顯微鏡還具有先進的光譜和模態成像能力。它包括能量色散光譜、能量過濾成像、X射線映射、俄歇光譜等特征。這使得它可以利用廣泛的成像和光譜處理,使其成為材料科學和研究的一大財富。最後,S 4500提供了許多附件,以提高圖像質量和更高分辨率的掃描。選項包括BSE檢測器、一系列物鏡、二次電子反向散射檢測器和一系列加速電壓濾波器。使用所有這些組件後,用戶可以輕松地根據需要對設備進行微調。由於其特點,HITACHI S-4500是一個強大的研究和材料分析工具。它能夠以極高的精度檢測和成像即使是最小的特征,而光譜和模態成像的範圍使它成為一個令人難以置信的通用機器。加上額外的配件,HITACHI S 4500可以調整以達到更高的性能,使其成為更加有用和可靠的工具。
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