二手 HITACHI S-4500 #9169489 待售
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ID: 9169489
Scanning electron microscope (SEM)
Specifications:
Photo CRT:
Ultra high resolution type
Recording area: 120 x 90 mm
Scanning mode:
Normal scan
Split screen / Dual magnification
Line scan
Position setting
Spot
AAF (Analysis area finder)
SAA (Selected area analysis)
Oblique mode
Scanning speed:
0.3, 2, 10, 20 S / Frame for viewing mode
TV, 40,80, 160 S / Frame for photo recording mode
Signal processing / Operation mode:
Automatic brightness & contrast control
Gamma control
Dynamic stigmator monitor
Auto focus
Automatic stigmator
Electrical image shift: ± 20 µm With WD 20 mm
Vacuum system:
Vacuum sequence: Full-auto pneumatic valve system
Ultimate vacuum:
7 x 10-4 Pa (Specimen chamber)
1 x 10-7 Pa (Electron gun chamber)
Vacuum pumps:
Electron optics: (3) Ion pumps
Specimen chamber:
(1) Diffusion pump
(2) Rotary pumps
Compressor
Ion pumps:
IP1= 0.1 x 10-7
IP2= 0.5 x 10-7
IP3= 6 x 10-7
Accessories:
THERMO-SCIENTIFIC EDS Tank
EDS Computer / Controller: No
GW Microchannel:
Control
Detector: No
GW Infrared: Camera control and camera on system
Control panel on SEM
Small manual stage
Performance:
Resolution: 1.5 nm
Accelerating voltage: 30 kV
Working distance: 7 mm
Magnification:
High magnification mode: 50x to 500,000x
Low magnification mode: 20x to 1,000x
Electron optics:
Electron gun: Cold-cathode field emission electron gun
Emission extracting voltage (Vext): 0 to 6.5 kV
Accelerating voltage (Vacc): 0.5 to 30 kV (Variable in 100 V step)
Lens system: 3-Stage electromagnetic lens
Objective aperture:
Movable aperture ((4) Opening selectable / Alignable outside column)
Self-cleaning type thin aperture
Stigmator: Electromagnetic type
Scanning coil: 2-Stage electromagnetic type
Display unit:
CRT: (2) 12" Display monitors including memory unit.
HITACHI S-4500是一種掃描電子顯微鏡（SEM），專門設計用於成像範圍廣泛的樣品表面，從大型標本到小型微觀結構。HITACHI S 4500的最大放大倍率為270,000倍,超高分辨率為0.7 nm,能夠揭示單個樣品中包含的大量細節。S-4500利用由兩個半球氣泡透鏡和一個投影透鏡組成的半無色物鏡，將高能電子束聚焦到一個精細點。光束以光柵模式在樣品上掃描，從樣品表面反射的電子在電子探測器中收集。然後將這些電子轉換為數字圖像，用於構造樣品表面的3D表示。S 4500還具有自動化的綜合測量和成像功能,可以直接從生成的圖像中進行測量。這允許對樣品進行定量分析，包括物理測量和電氣特性。這些測量對於廣泛的行業和研究應用至關重要。HITACHI S-4500有一個真空環境室，允許它與需要在真空條件下檢驗的樣品一起使用。這對於生物組織和半導體器件等樣品的檢驗尤為重要。SEM還包含一個自動化的樣品交換系統，使樣品能夠在不打破真空的情況下快速高效地進行更換。HITACHI S 4500產生高度詳細的圖像,使科學家和工程師能夠以復雜的細節研究任何給定樣品的表面。這反過來又使他們能夠分析和識別缺陷，分析材料組成，更深入地了解各種組件和產品的微觀結構。因此，HITACHI的S-4500是許多行業的寶貴工具，從汽車工程和微電子學到材料科學和生物成像。
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