二手 HITACHI S-4700 Type II #9226563 待售

ID: 9226563
優質的: 1998
Field Emission Scanning Electron Microscope (FE-SEM), 6" Substrates, 6" Main unit: HITACHI FE Tip (Vext 4.7) (4) BARTON Ion pumps Main chamber pump: Diffusion pump Stage: Type 2 (5 Axes motor) (2) SE Detectors Ion pump power: HITACHI Electron BSE Detector Vibration isolation table Utility: (2) Rotary pumps Down transformer: Auto transformer (2) Pumping hose types Resolution: Accelerating voltage: 15 kV Working distance: 12 mm - 1.5 nm Accelerating voltage: 1 kV Working distance: 2.5 mm - 2.5 nm Magnification: High magnification mode: 100x to 500,000x Low magnification mode: 20x to 2,000x Electron optics: Electron gun: Cold cathode field emission type Extracting voltage (Vext): 0 to 6.5 kV Accelerating voltage (Vacc): 0.5 to 30 kV (in 100 V steps) Lens: 3 Stages electromagnetic lens, reduction type Objective lens aperture: Movable aperture (4 Openings selectable / Alignable outside column) Self-cleaning thin aperture Astigmatism correction coil (Stigmator) type: Electromagnetic Scanning coil type: 2 Stages electromagnetic-deflection Specimen stage: X Traverse: 0 to 25 mm Y Traverse: 0 to 25 mm Z Traverse: 2.5 to 27.5 mm Tilt: -5° to +45° Airlock type: Specimen exchange: 100 mm (Diameter) Display unit: Display type: LCD Monitor Photo CRT (Option): Ultra-high resolution (Effective field of view 120 × 90 mm) Control PC: COMPAQ DC7700 Control panel: HITACHI Image control panel Keyboard: HP 101 Keyboard (English) Operating system: Windows XP Scanning modes: (Normal scan) Reduced area scan Line scan Sport analysis Average concentration analysis Scanning speeds: Fast, slow 0.5 to 40 / sec per frame for viewing 20/17, 40/33, 80/67, 160/167, 320/333 sec per frame for photo mode Value of (50 / 60 Hz) Fast: NTSC / PAL Signal Evacuation system: System type: Fully automatic pneumatic-valve system Ultimate vacuum levels: Specimen chamber: 7 x 10^-4 Pa Electron gun chamber: IP-1: 1 x 10^-7 Pa / Better IP-2: 2 x 10^-6 Pa / Better IP-3: 7 x 10^-5 Pa / Better Vacuum pumps: Electron optical system: (3) Ion pumps Specimen chamber: Turbo molecular pump (2) Oil rotary pumps Compressor: Oil-less type compressor Protection devices: Power failure Cooling-water interruption Inadequate vacuum 1998 vintage.
HITACHI S-4700 Type II是一種掃描電子顯微鏡(SEM),可實現表面、薄膜和其他材料的高分辨率圖像。它可實現超過10,000倍的放大倍數,並產生復雜的成像結果。該系統的設計融合了極高的精度、便攜性和高效的操作。HITACHI S 4700 TYPE II SEM由光學柱、電子機櫃、樣品室和控制控制臺組成。利用場發射電子槍發射電子束,以創建高分辨率圖像。利用柱光學器件對樣品表面進行精細掃描,對電子束進行調制和成形。它也有一個大型的標本表,能容納各種形狀和大小的標本。然後將光束加速並聚焦到樣品上,生成一個信號,從電子撞擊樣品時放電的次級電子和反向散射電子中檢測到該信號。此信息顯示在控制控制臺上,控制臺上包含可調增益和信號處理控制單元。SEM控制面板還允許用戶調整光束電流/電壓、掃描速度、光斑大小和圖像存儲設置。S-4700 II型具有透射電子顯微鏡(TEM)模式的調焦旋鈕,可提供離子切片膜的更詳細圖像。它還采用深度剖面圖,使用戶能夠以各種放大倍數監測樣品的深度剖面圖。此外,亮度調節旋鈕為用戶提供了降低信號噪聲水平和產生更多對比圖像的能力。該系統產生了非常高質量的圖像,適用於包括細胞生物學、材料科學和金相學在內的多種應用。它是一個極其完善的系統,經過設計,能夠承受實驗室使用的嚴酷。它易於操作,可移植性確保方便現場或遠程使用。
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