二手 HITACHI S-4700 #150536 待售

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製造商
HITACHI
模型
S-4700
ID: 150536
FE SEM 1.5 nm resolution at 15 kV, 12 mm WD 2.5 nm resolution at 1 kV, 2.5 mm WD Magnification ranges: 30x to 500,000x Specimen tilt at 12 mm WD up to 45° Brightness: ~ 2 X 109 A / cm2/sr Energy spread: 0.2 to 0.3 eV Sample capacity: 100mm diameter x 17mm thick H maximum Oil-free vacuum systems pump column and sample exchange Image modes: secondary and backscattered electron images (2) Secondary electron detectors: above and below objective lens Digital image formats: BMP, TIFF, JPEG at 640 X 480, 1280 X 960, or 1560 X 1920 pixels Includes: Non-cryo sample holders CryoSEM observation using EMITECH K-1250 cryo stage Backscatter imaging at TV rates and low voltage (threshold 2.5 kV on gold) with Autrata modified YAG (yttrium aluminum garnet, cerium doped) crystal KEITHLEY specimen current detector Applications: High-resolution topographic contrast (Se) and atomic number contrast (BSe) imaging of biological and non-biological samples in both room temperature and cryo modes Applicable to imaging of immunogold labeled individual cells and bacteria Specifications: Secondary electron image resolution 2.1 nm guaranteed (at 1 kV) 1.5 nm guaranteed (at 15 kV and W.D. 12 mm or X-ray analysis position) Backscattered electron image resolution (optional) 3.0 nm guaranteed (at 15 kV YAG detector, optional) Cold finger and specimen exchange chamber as standard. Allowing sample exchange via airlock without repositioning Optional integrated EDX system with 30 degree take-off angle Fully digital imaging, image processing and archiving system Dual SE detectors for versatile imaging (SE and BSE) ExB energy filter Beam shift: +/-15um.
HITACHI S-4700是一種掃描電子顯微鏡(SEM),是HITACHI Ltd生產的S系列 SEM的一部分。HITACHI S 4700是一款高性能的SEM,能產生高品質的圖像,並具有多種用戶友好的功能。S-4700具有許多獨特的特點,使其成為用於研究和教育設施的絕佳選擇。它有一個大的視場(FOV),允許它捕獲大樣本和區域的圖像。它具有高分辨率和對比度功能,可產生細膩而清晰的圖像,背景噪音最小。圖像堆棧模式允許用戶獲取具有各種視角和放大倍數的多個連續切片。S 4700非常適合各種樣品類型。其高速、強大的放大範圍(最高1000倍)使其適合以納米級分辨率觀察金屬、陶瓷等事物。它的大範圍電壓設置(0.5kV-30kV)允許用戶快速調整顯微鏡以觀察具有多種形狀、大小和材料的樣品。電子束的小點和柱尺寸選項為樣品觀測提供了進一步的靈活性。HITACHI S-4700還配備了大量用戶友好的功能。其大型液晶顯示屏和觸摸屏界面可方便地訪問SEM的所有功能和設置。它的低溫模式,自動漂移校正系統,以及自動中心攝像頭使數據采集過程變得簡單而無憂。總之,HITACHI S 4700是一款高性能的SEM,可產生高質量的圖像,並具有多種用戶友好的功能。它用途廣泛,使用戶可以探索各種樣品和材料。其廣闊的視野和強大的放大範圍使其適合納米級分辨率的金屬和陶瓷觀測等應用。
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