二手 HITACHI S-4700 #293632285 待售

Field Emission Scanning Electron Microscope (FE-SEM), 6" Electron gun: Cold field emission type Lens system: 3-Stage electromagnetic lens reduction method Objective lens: Movable aperture Correction coil: 8-Pole electromagnetic system Scanning coil: 2-Stage Type II Sample fine movement device Secondary electron resolution: 1.5 nm Acceleration voltage: 15 kV, WD: 12 mm 2.1 nm Acceleration voltage: 1 kV, WD: 2.5 mm Magnification: LM Mode: 20-2,000x HM Mode: 100-500,000x 5-Axis motor driving: X: 0~100 mm Y: 0~50 mm Z: 2.5~30.0 mm T: -5°~60° R: 360° Detector: Secondary electron detector Ultra-sensitive reflected electron detector Energy dispersive X-ray detector Scan mode: Normal scan Selected area scan Line scan Photo scan Spot position Average concentration distribution Dual mug / split Oblique PC: Pentium 32 MHz or higher RAM: 32 MB or more HDD: 2.4 GB or more Operating system: Microsoft Windows NT Color monitor, 17" CRT, 7" Signal processing: Real-time image display Automatic image adjustment (Brightness, contrast) Gamma control Derivative image display (Contour enhancement) Inverted image display Autofocus (AFC) Auto stigma Memory: 2560 x 1920 Image integration Contrast conversation Color display Beam blanking Raster rotation / tilit competition Scanning speed: TV, slow 0.5-40s/frame Electrical field of view movement: ± 15 µm (when WD= 12 nm) Frame capacity: 1280 x 960 640 x 480 2560 x 1920 Display size: Standard: 640 x 480 (2) Screen displays: 512 x 480 Full 1024 x 700 Digital beam control Pre-processing related: YAG Type reflected electron detector Energy dispersive X-ray analyzer E-1030 Mild sputtering equipment Multi-prep system Ethernet network interface Video amplifier unit Photomal power supply unit Acceleration voltage: 0.5–30 kV (0.1 kV step) 2000 vintage.