二手 HITACHI S-4700 #9058859 待售

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HITACHI S-4700
已售出
製造商
HITACHI
模型
S-4700
ID: 9058859
優質的: 1998
Field emission scanning electron microscope (FE SEM) Type I Resolution: Accelerating voltage: 15 kV Working distance: 12 mm 1.5 nm Accelerating voltage: 1 kV Working distance: 2.5 mm 2.5 nm Magnification: High magnification mode: 100x to 500,000x Low magnification mode: 20x to 2,000x Electron optics: Electron gun: Cold cathode field emission Extracting voltage (Vext): 0 to 6.5kV Accelerating voltage (Vacc): 0.5 to 30kV (in 100V steps) Lens: 3-stage electromagnetic lens, reduction type Objective lens aperture: Moveable aperture (4) Openings selectable / Align-able outside column Self-cleaning thin aperture Astigmatism correction coil (Stigmator): Electromagnetic type Scanning coil: 2-stage electromagnetic-deflection type Specimen stage: X Traverse o to 25 mm (Continuous) Y Traverse o to 25 mm (Continuous) Z Traverse 2.5 to 27.5 mm (Continuous) Tilt -50 to +450 Rotation: 3600 (Continuous) Specimen size (Airlock type specimen exchange) Maximum: 100 mm (Diameter) Display unit: Display type: Flicker- free image on PC monitor (Full scanning speeds) Viewing monitor: Type 17 Color: 1024 x 768 pixels Photo CRT (Option): Ultra-high resolution type (Effective field of view 120 x 90 mm) Scanning modes: Normal Reduced area Photo Split/Dual magnification Line Position setting Spot AAF (Analysis Area Finder) SAA (Selected Area Analysis) Scanning speeds: Fast Slow: 0.5 to 40 see for frame viewing For photo mode: 20/17, 40/33, 80/67, 160/167, 320/333 Fast: NTSC or PAL signal Value of (50 HZ)/(60 Hz) Signal processing modes: Automatic brightness control Gamma control Automatic focus Automatic stigmator Automatic data display: Film number Accelerating voltage Magnification Micron bar Micron value Date / Time and working distance Data entry: Alphanumeric characters Numbers and marks can be written on image from keyboard Electrical image shift: +/- 15um (WD = 12mm) Evacuation system: System type: Fully automatic pneumatic-valve Ultimate vacuum levels: Specimen chamber 7 x 10'4 Pa Electron gun chamber: IP-1 2 x 10'7 Pa IP-2 2 x 10'6 Pa IP-3 7 x 10'5 Pa Vacuum pumps: Electron optical system: (3) Ion pumps Specimen chamber: Oil diffusion pump Turbo molecular pump (option) (2) Oil rotary pumps Oil-less type compressor Protection devices: Warning devices power failure Cooling-water interruption Inadequate vacuum Others: Acoustic noise Less than 65 dB Dielectric voltage-withstand: 1500VAC/1min No EDX 1998 vintage.
HITACHI S-4700是為一系列高性能應用而設計的高級掃描電子顯微鏡(SEM)。顯微鏡結合了高分辨率和放大成像以及廣泛的標本觀測模式。HITACHI S 4700具有重新設計的控制系統,稱為SmartMeister,優化了操作和數據采集體驗。SmartMeister的用戶友好界面旨在使復雜的數據分析過程更易於理解,並允許用戶對成像條件進行快速調整。儀器配有可變真空室,確保在保持高圖像分辨率的同時精確觀察樣品。可變真空室還有助於通過防止空氣進入腔室來顯著減少汙染。S-4700實現高分辨率成像,納米級分辨率和放大倍數可達300,000倍。該儀器還包含了廣泛的控制和分析功能,包括可以定制以滿足各種要求的高級分析軟件。顯微鏡包括二次電子成像(SEI)、反向散射電子成像(BEI)、能量色散光譜(EDS)和電子反向散射衍射(EBSD)等觀測模式。這些模式允許對廣泛的材料特性進行詳細分析,包括組成人口統計學、地形學以及對局部電場的評價。S 4700能夠生成對象的3D圖像,並配備了自動化操作功能,從而實現了節省時間和一致的操作。該儀器還包括一個大型樣板階段、一個自動化的樣板變更機制、一個全自動的查看系統,以及對實施自動化工作流程的支持。總體而言,HITACHI S-4700是一種高級掃描電子顯微鏡,專為一系列高性能應用而設計。該儀器包含各種控制和分析功能,能夠對材料特性和自動化能力進行詳細分析,以實現高效操作。
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