二手 HITACHI S-4700 #9058859 待售
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ID: 9058859
優質的: 1998
Field emission scanning electron microscope (FE SEM)
Type I
Resolution:
Accelerating voltage: 15 kV
Working distance: 12 mm 1.5 nm
Accelerating voltage: 1 kV
Working distance: 2.5 mm 2.5 nm
Magnification:
High magnification mode: 100x to 500,000x
Low magnification mode: 20x to 2,000x
Electron optics:
Electron gun: Cold cathode field emission
Extracting voltage (Vext): 0 to 6.5kV
Accelerating voltage (Vacc): 0.5 to 30kV (in 100V steps)
Lens: 3-stage electromagnetic lens, reduction type
Objective lens aperture: Moveable aperture
(4) Openings selectable / Align-able outside column
Self-cleaning thin aperture
Astigmatism correction coil (Stigmator): Electromagnetic type
Scanning coil: 2-stage electromagnetic-deflection type
Specimen stage:
X Traverse o to 25 mm (Continuous)
Y Traverse o to 25 mm (Continuous)
Z Traverse 2.5 to 27.5 mm (Continuous)
Tilt -50 to +450
Rotation: 3600 (Continuous)
Specimen size (Airlock type specimen exchange)
Maximum: 100 mm (Diameter)
Display unit:
Display type: Flicker- free image on PC monitor (Full scanning speeds)
Viewing monitor: Type 17
Color: 1024 x 768 pixels
Photo CRT (Option): Ultra-high resolution type (Effective field of view 120 x 90 mm)
Scanning modes: Normal
Reduced area
Photo
Split/Dual magnification
Line
Position setting
Spot
AAF (Analysis Area Finder)
SAA (Selected Area Analysis)
Scanning speeds: Fast
Slow: 0.5 to 40 see for frame viewing
For photo mode: 20/17, 40/33, 80/67, 160/167, 320/333
Fast: NTSC or PAL signal Value of (50 HZ)/(60 Hz)
Signal processing modes:
Automatic brightness control
Gamma control
Automatic focus
Automatic stigmator
Automatic data display:
Film number
Accelerating voltage
Magnification
Micron bar
Micron value
Date / Time and working distance
Data entry:
Alphanumeric characters
Numbers and marks can be written on image from keyboard
Electrical image shift: +/- 15um (WD = 12mm)
Evacuation system:
System type: Fully automatic pneumatic-valve
Ultimate vacuum levels: Specimen chamber 7 x 10'4 Pa
Electron gun chamber:
IP-1 2 x 10'7 Pa
IP-2 2 x 10'6 Pa
IP-3 7 x 10'5 Pa
Vacuum pumps: Electron optical system: (3) Ion pumps
Specimen chamber: Oil diffusion pump
Turbo molecular pump (option)
(2) Oil rotary pumps
Oil-less type compressor
Protection devices:
Warning devices power failure
Cooling-water interruption
Inadequate vacuum
Others:
Acoustic noise Less than 65 dB
Dielectric voltage-withstand: 1500VAC/1min
No EDX
1998 vintage.
HITACHI S-4700是為一系列高性能應用而設計的高級掃描電子顯微鏡(SEM)。顯微鏡結合了高分辨率和放大成像以及廣泛的標本觀測模式。HITACHI S 4700具有重新設計的控制系統,稱為SmartMeister,優化了操作和數據采集體驗。SmartMeister的用戶友好界面旨在使復雜的數據分析過程更易於理解,並允許用戶對成像條件進行快速調整。儀器配有可變真空室,確保在保持高圖像分辨率的同時精確觀察樣品。可變真空室還有助於通過防止空氣進入腔室來顯著減少汙染。S-4700實現高分辨率成像,納米級分辨率和放大倍數可達300,000倍。該儀器還包含了廣泛的控制和分析功能,包括可以定制以滿足各種要求的高級分析軟件。顯微鏡包括二次電子成像(SEI)、反向散射電子成像(BEI)、能量色散光譜(EDS)和電子反向散射衍射(EBSD)等觀測模式。這些模式允許對廣泛的材料特性進行詳細分析,包括組成人口統計學、地形學以及對局部電場的評價。S 4700能夠生成對象的3D圖像,並配備了自動化操作功能,從而實現了節省時間和一致的操作。該儀器還包括一個大型樣板階段、一個自動化的樣板變更機制、一個全自動的查看系統,以及對實施自動化工作流程的支持。總體而言,HITACHI S-4700是一種高級掃描電子顯微鏡,專為一系列高性能應用而設計。該儀器包含各種控制和分析功能,能夠對材料特性和自動化能力進行詳細分析,以實現高效操作。
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