二手 HITACHI S-4800 #9209753 待售

製造商
HITACHI
模型
S-4800
ID: 9209753
優質的: 2008
Field Emission Scanning Electron Microscope (FE-SEM) With HORIBA EDX system Workstation: HP DC7100MT Declaration mode: 2.0 nm at 1 kV, WD: 1.5 mm, Normal mode Stigmator: Octopole electromagnetic EYELA Cool Ace CA-1111 Chiller UPS HITACHI Air compressor Operating system: Windows XP Resolution: Accelerating voltage: 15 kV Working distance: 4 mm to 1.0 nm (220,000x) Accelerating voltage: 1 kV Working distance: 1.5 mm to 2.0 nm (120,000x) Magnification: High magnification mode: 100x to 800,000x Low magnification mode: 20x to 2,000x Electron optics: Electron gun: Cold cathode field emission type Extracting voltage (Vext): 0 to 6.5 kV Accelerating voltage (Vacc): 0.5 to 30 kV (in 100 V steps) Lens: 3-Stage electromagnetic lens, reduction type Objective lens aperture: Movable aperture (4 Openings selectable / Alignable outside column) Self-cleaning thin aperture Astigmatism correction coil: Electromagnetic type (Stigmator) Scanning coil: 2-Stage electromagnetic electron optics Specimen stage: X-Traverse: 0 to 50 mm (Continuous) Y-Traverse: 0 to 50 mm (Continuous) Z-Traverse: 1.5 to 30.0 mm (Continuous) Tilt: -5° to +70° Rotation: 360° (Continuous) Specimen size: Max 100 mm (Diameter) (Airlock type specimen exchange) Display unit: Display type: Flicker-free image on PC monitor (Full scanning speeds) Viewing monitor: Type 18.1 LCD Option: Type 21 Color CRT (1280 x 1024 pixels) Photo CRT (Option): Ultra-high resolution type (Effective field of view 120 x 90 mm) Full screen: 1280 x 960 Pixels Reduced area: 640 x 480 Pixels 320 x 240 Pixels Dual Image: 640 x 480 Pixels Scanning modes: Normal scan Reduced area scan Line scan Spot analysis Average concentration analysis Split / Dual magnification Scanning speeds: TV (640 x 480 pixel display: 25 / 30 frames/s) Fast (Full screen display: 6.25 / 7.5 frames/s) Slow: (Full screen display: 1 / 0.9 , 4 / 3.3 , 20 / 16, 40 / 32 ,80 / 64 Frames/s) (640 x 480 pixels display: 0.5 / 0.4 , 2 / 1.7 , 10 / 8 , 20 / 16, 40 / 32 Frames/s) Photograph: 2560 x 1920 Pixels Display: 40 / 32, 80 / 64, 160 / 128, 320 / 256 Frames/s Value: 50 Hz / 60 Hz TV: NTSC or PAL Signal Signal processing modes: Automatic brightness control Gamma control Automatic focus Automatic stigmator Automatic data display: Image number Accelerating voltage Magnification Micron bar Micron value Data / Time Data entry: Alphanumeric characters, number, and marks Electrical image shift: 12 m (WD: 8 mm) Evacuation system: System type: Fully automatic pneumatic-valve system Ultimate vacuum levels: Specimen chamber: 7 x Pa 10-7 Pa in electron gun chamber 10-4 Pa in specimen chamber Electron gun chamber: IP1 1 x Pa or better IP2 2 x Pa or better IP3 7 x Pa or better Vacuum pumps: ULVAC GLD-136 Electron optical system: (3) Ion pumps Specimen chamber: Turbo molecular pump Oil rotary pump Protection devices: Warning devices: Power failure Cooling-water interruption Inadequate vacuum Secondary electron image resolution: 1.0 nm at 15 kV, WD: 4 mm 1.4 nm at 1 kV, WD: 1.5 mm Sample chamber: Size: Type I stage Max sample size: 100 mm Diameter Stage motion: 3 Axis motorized X/Y: 0 - 50 mm Signal selection: SE Signal X-Ray signal AUX Signal UPS Unit Chiller FE-SEM Rotary pump Main body: Stage controller (ROM PCB) EVAC Controller (ROM PCB) (3) Ion pumps SE Detector Multi-aperture Gun head cap STP301H TMP Pump STP301H TMP Controller Solenoid valve assy PC Hard Disk Drive (HDD) Operating system: Windows XP HV Controller Gun head unit Case Operation unit: LCD Monitor Keyboard Mouse Operation panel Stage control trackball ETC: Ion coater rotary pump LN2 UPS EDS Control HUB EDS Controller Operating system: Windows XP Baking tool Ion coater HP Office Jet Pro C8194A Printer Manuals included 4 kVA For voltage other than 100V AC Power requirements: 100V AC (±10% ), Single phase, 50/60 Hz 2008 vintage.
HITACHI S-4800是一種掃描電子顯微鏡(SEM),既提供卓越的圖像質量,又具有通用的分析能力。這種高端儀器設計用於一系列研究和工業應用,如材料和生命科學調查、樣品分析、故障分析、截面和表面測量。HITACHI S 4800配備了鎢絲電子發射器、可變壓力(VP)和可變壓力可變溫度(VPVT)功能。VP和VPVT模式使樣品能夠在不同的壓力水平和溫度下查看,從而能夠更深入和更準確地描述特征。此外,該顯微鏡還具有直徑140mm的大探測面積,在二次電子圖像(SEI)模式下具有高分辨率,高達1nm點分辨率。此外,先進的低真空模式(ALV)提供了在非導電材料上檢測SEM圖像的能力。靈活的S-4800設計使其能夠用於多種技術,如反向散射電子(BSE)成像、EDX元素分析和WDS用於定性和定量元素分析。此外,立體聲和3D成像功能提供了樣本的全面表征。先進的成像包括實時和單色顯示器,以及數字圖像測量工具,以實現內部結構和表面特性的精確測量和指定。此外,較大的樣品室和較高的提升級能夠有效的樣品處理和操作.S 4800還擁有廣泛的配件,如一系列先進的探測器和電子柱升級,以及一個能夠自動獲取圖像的自動成像系統。此外,先進的能量過濾有助於研究能量色散X射線信號。總體而言,HITACHI S-4800是一款功能強大的高端SEM,旨在滿足各種研究和工業應用的需求。它提供了卓越的圖像質量和先進的分析能力,通過其多用途的設計,使用戶能夠獲得被分析樣本的精確和準確的視圖。
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