二手 HITACHI S-4800 #9209753 待售
網址複製成功!
單擊可縮放
ID: 9209753
優質的: 2008
Field Emission Scanning Electron Microscope (FE-SEM)
With HORIBA EDX system
Workstation: HP DC7100MT
Declaration mode: 2.0 nm at 1 kV, WD: 1.5 mm, Normal mode
Stigmator: Octopole electromagnetic
EYELA Cool Ace CA-1111 Chiller
UPS
HITACHI Air compressor
Operating system: Windows XP
Resolution:
Accelerating voltage: 15 kV
Working distance: 4 mm to 1.0 nm (220,000x)
Accelerating voltage: 1 kV
Working distance: 1.5 mm to 2.0 nm (120,000x)
Magnification:
High magnification mode: 100x to 800,000x
Low magnification mode: 20x to 2,000x
Electron optics:
Electron gun: Cold cathode field emission type
Extracting voltage (Vext): 0 to 6.5 kV
Accelerating voltage (Vacc): 0.5 to 30 kV (in 100 V steps)
Lens: 3-Stage electromagnetic lens, reduction type
Objective lens aperture:
Movable aperture (4 Openings selectable / Alignable outside column)
Self-cleaning thin aperture
Astigmatism correction coil: Electromagnetic type (Stigmator)
Scanning coil: 2-Stage electromagnetic electron optics
Specimen stage:
X-Traverse: 0 to 50 mm (Continuous)
Y-Traverse: 0 to 50 mm (Continuous)
Z-Traverse: 1.5 to 30.0 mm (Continuous)
Tilt: -5° to +70°
Rotation: 360° (Continuous)
Specimen size: Max 100 mm (Diameter)
(Airlock type specimen exchange)
Display unit:
Display type: Flicker-free image on PC monitor (Full scanning speeds)
Viewing monitor: Type 18.1 LCD
Option: Type 21 Color CRT (1280 x 1024 pixels)
Photo CRT (Option): Ultra-high resolution type
(Effective field of view 120 x 90 mm)
Full screen: 1280 x 960 Pixels
Reduced area:
640 x 480 Pixels
320 x 240 Pixels
Dual Image: 640 x 480 Pixels
Scanning modes:
Normal scan
Reduced area scan
Line scan
Spot analysis
Average concentration analysis
Split / Dual magnification
Scanning speeds:
TV (640 x 480 pixel display: 25 / 30 frames/s)
Fast (Full screen display: 6.25 / 7.5 frames/s)
Slow:
(Full screen display: 1 / 0.9 , 4 / 3.3 , 20 / 16, 40 / 32 ,80 / 64 Frames/s)
(640 x 480 pixels display: 0.5 / 0.4 , 2 / 1.7 , 10 / 8 , 20 / 16, 40 / 32 Frames/s)
Photograph: 2560 x 1920 Pixels
Display: 40 / 32, 80 / 64, 160 / 128, 320 / 256 Frames/s
Value: 50 Hz / 60 Hz
TV: NTSC or PAL Signal
Signal processing modes:
Automatic brightness control
Gamma control
Automatic focus
Automatic stigmator
Automatic data display:
Image number
Accelerating voltage
Magnification
Micron bar
Micron value
Data / Time
Data entry: Alphanumeric characters, number, and marks
Electrical image shift: 12 m (WD: 8 mm)
Evacuation system:
System type: Fully automatic pneumatic-valve system
Ultimate vacuum levels: Specimen chamber: 7 x Pa
10-7 Pa in electron gun chamber
10-4 Pa in specimen chamber
Electron gun chamber:
IP1 1 x Pa or better
IP2 2 x Pa or better
IP3 7 x Pa or better
Vacuum pumps: ULVAC GLD-136
Electron optical system: (3) Ion pumps
Specimen chamber: Turbo molecular pump
Oil rotary pump
Protection devices:
Warning devices:
Power failure
Cooling-water interruption
Inadequate vacuum
Secondary electron image resolution:
1.0 nm at 15 kV, WD: 4 mm
1.4 nm at 1 kV, WD: 1.5 mm
Sample chamber:
Size: Type I stage
Max sample size: 100 mm Diameter
Stage motion:
3 Axis motorized
X/Y: 0 - 50 mm
Signal selection:
SE Signal
X-Ray signal
AUX Signal
UPS Unit
Chiller
FE-SEM Rotary pump
Main body:
Stage controller (ROM PCB)
EVAC Controller (ROM PCB)
(3) Ion pumps
SE Detector
Multi-aperture
Gun head cap
STP301H TMP Pump
STP301H TMP Controller
Solenoid valve assy
PC
Hard Disk Drive (HDD)
Operating system: Windows XP
HV Controller
Gun head unit
Case
Operation unit:
LCD Monitor
Keyboard
Mouse
Operation panel
Stage control trackball
ETC:
Ion coater rotary pump
LN2
UPS
EDS
Control HUB
EDS Controller
Operating system: Windows XP
Baking tool
Ion coater
HP Office Jet Pro C8194A Printer
Manuals included
4 kVA For voltage other than 100V AC
Power requirements: 100V AC (±10% ), Single phase, 50/60 Hz
2008 vintage.
HITACHI S-4800是一種掃描電子顯微鏡(SEM),既提供卓越的圖像質量,又具有通用的分析能力。這種高端儀器設計用於一系列研究和工業應用,如材料和生命科學調查、樣品分析、故障分析、截面和表面測量。HITACHI S 4800配備了鎢絲電子發射器、可變壓力(VP)和可變壓力可變溫度(VPVT)功能。VP和VPVT模式使樣品能夠在不同的壓力水平和溫度下查看,從而能夠更深入和更準確地描述特征。此外,該顯微鏡還具有直徑140mm的大探測面積,在二次電子圖像(SEI)模式下具有高分辨率,高達1nm點分辨率。此外,先進的低真空模式(ALV)提供了在非導電材料上檢測SEM圖像的能力。靈活的S-4800設計使其能夠用於多種技術,如反向散射電子(BSE)成像、EDX元素分析和WDS用於定性和定量元素分析。此外,立體聲和3D成像功能提供了樣本的全面表征。先進的成像包括實時和單色顯示器,以及數字圖像測量工具,以實現內部結構和表面特性的精確測量和指定。此外,較大的樣品室和較高的提升級能夠有效的樣品處理和操作.S 4800還擁有廣泛的配件,如一系列先進的探測器和電子柱升級,以及一個能夠自動獲取圖像的自動成像系統。此外,先進的能量過濾有助於研究能量色散X射線信號。總體而言,HITACHI S-4800是一款功能強大的高端SEM,旨在滿足各種研究和工業應用的需求。它提供了卓越的圖像質量和先進的分析能力,通過其多用途的設計,使用戶能夠獲得被分析樣本的精確和準確的視圖。
還沒有評論