二手 HITACHI S-9220 #9200635 待售
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ID: 9200635
CD Scanning electron microscope, 8"
System information:
Work station
Model: B180L
O/S: HP Unix
General specifications:
SEMI/JEIDA standard orientation
Flat or V notch wafers
Measurement method: Cursor / Line profile
Measurement range: 0.1µm ~ 2.0 µm
Measurement repeatability: ±1% / 3 nm (3 sigma) whichever larger
Throughput: 56 Wafers/hr
Measured points: 1 Point/chip, 5 Chips/wafer
Secondary electron image resolution: 3nm
Image magnification: 500 ~ 300kx
Electron optics system:
Electron gun: Schottky emission
Accelerating voltage: 500 ~ 1,600 V
Lens system:
Scintillator/photomultiplier detection system
ExB Filter
SE / BSE Electrons
Objective lens aperture: Heating type movable aperture
Fine adjustment possible
Scanning coil: 2 stage electromagnetic deflection
Stigmator coil: 8-pole electromagnetic type (X, Y axes)
Probe current monitoring: Faraday cup incorporated, with automatic measurement
Optical microscope: 1.2-mm-square visual field, monochrome image
Stage:
Movement range: X, Y: 0 ~ 200mm
Driving method: Pulse motor
Control/speed:
Positioning contro
Linear encoder
Maximum speed: 100mm/s
Loader:
Wafer transfer:
Cassette to loader chamber: Auto transfer via wafer transfer robot
Loader chamber to stage: Auto evacuation and auto loading
Wafer transfer robot system:
Random access using two cassettes
Wafer detection in cassette: Automatic detection via wafer searcher
Chucking method: Vacuum chucking on back of wafer
Orientation flat / V notch detection: Non-contact auto detection via optical sensor
Control and display system:
CRT:
EWS 21 Type monitor display of SEM and OM images
GUI Operation screen
Wafer map
Measured values
Stage coordinates
Scanning modes:
TV Scan
HR Scan
Slow scan
With auto brightness/contrast function
Image Processing:
Hardware processing using DSP (Option)
Recording:
Video printer output function (Option)
Image filing function (Option)
Safety device: Equipped with emergency off swith
CD Measurement data processing system:
File storage: Storage function for various setting parameters, measurement results
Storage media:
Hard disk (9.1GB) incorporated in EWS
3.5 Type magneto-optic disk
3.5" Floppy disk
Data process function:
Statistics output
Worksheet system
Output of measured values in real time graph
Printout: 80 Character thermal printer
Evacuation system:
Full automatic
Dry / Clean evacuation
Vacuum pumps :
(3) Ion pumps
(2) Turbo molecular pumps
(2) Oil rotary pumps
Safety devices:
Protective device against:
Power failure
Column vacuum level drop
Dry air pressure drop
Cooling water flow rate drop
Grounding: 1000 or less (Single)
Nitrogen:
200 ~ 680kPa
Pipe outer diameter: 6mm
Vacuum:
P: 1.3 ~ 21.3 kPa or less
Pipe outer diameter: 6mm
Circulation cooling water:
98.1 ~ 196kPa
Pipe outer diameter: 15mm
Environmental conditions:
Magnetic field:
AC magnetic field: 0.3µT or less
DC magnetic field: 0.1µT or less
Vibration:
Horizontal direction:
1Hz: 3µm (P-P) Max
2Hz: 0.7µm (P-P) Max
3Hz: 1.2µm (P-P) Max
4Hz: 2µm (P-P) Max
5Hz: 3µm (P-P) Max
10Hz: 3.5µm (P-P) Max
Noise: Less than 75 dB
Room temperature: 20 ~ 25°C (Δt = ±2°C)
Humidity: 60% or less
Utility:
Power:
100 V, 200 V, 208 V, 230 VAC
6 kVA
50/60 Hz
1 Phase
2001 vintage.
HITACHI S-9220是一種最先進的掃描電子顯微鏡(SEM)。這種電子探針顯微鏡是分析結構到亞納米分辨率的通用平臺。它在1-2納米範圍內提供了出色的像素分辨率,並且優化了被檢查樣品的長度和廣度的圖像質量和分辨率。HITACHI S9220高達1,000,000倍震級的高放大倍率使研究人員能夠仔細檢查納米級物體的最小細節。常規SEM需要一個真空室進行操作,S 9220也不例外;但是,它使用大型商用幹式真空設備,可確保高可靠性,同時提供卓越的性能。這種真空系統限制了離子、空氣分子和其他可能導致偽影出現在圖像中的粒子的影響。超低真空(ULV)單元的使用使腔室內的壓力保持更長的時間,允許從樣品中收集更多的信息並產生更好的圖像質量。HITACHI S 9220配備了一臺成像機,該成像機包括在高能級發射電子的野外發射槍、將這些電子聚焦到樣品上的冷凝器透鏡、收集信號的檢測器和處理圖像的圖像檢測器。這種成像工具由於其精密透鏡和高能電子可以很容易地穿透樣品並映射其原子結構,因此提供了優越的性能。S-9220的樣本階段能夠圍繞4軸(x、y、z和旋轉)移動樣品,以精確操縱需要成像的所需區域。標本持有者允許標本的範圍從大而重的樣本到細膩而小的樣本。此外,樣品階段還設有一個溫度控制單元,在冷卻過程中包含樣品並分析其化學成分。S9220還包含兩個測量工具來分析樣品。第一個工具是能量色散X射線光譜(EDS)探測器。這個單位使試樣的化學成分能夠以非常高的精確度來測定。另一種工具是X射線衍射工具(XRD)。這個量規允許研究人員從不同角度和方向確定材料的結晶結構。總體而言,HITACHI S-9220是進行納米物體詳細分析的理想掃描電子顯微鏡。其龐大的商用幹真空資產、高能電子成像模型以及多個階段和工具使這種SEM可靠而精確,使研究人員能夠輕松獲得準確和高分辨率的圖像。
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