二手 JEOL JEM 2010F #293595837 待售

Transmission Electron Microscope (TEM) Ultra High Resolution (UHR) / High Resolution (HR) / High specimen Tilt (HT) / Cryo Polepice (CR) / High Contrast (HC) Polepice: URP / HRP / HTP / CRP / HCP Point: 0.19 nm / 0.23 nm / 0.25 nm / 0.27 nm / 0.31 nm Lattice: 0.1 nm / 0.1 nm / 0.1 nm / 0.14 nm / 0.14 nm Focal length: 1.9 mm / 2.3 mm / 2.7 mm / 2.8 mm / 3.9 mm Spherical coefficient: 0.5 mm / 1.0 mm / 1.4 mm / 2.0 mm / 3.3 mm Chromatic coefficient: 1.1 mm / 1.4 mm / 1.8 mm / 2.1 mm / 3.0 mm Focal step: 1.0 nm / 1.4 nm / 1.8 nm / 2.0 nm / 5.2 nm Solid angle (30 mm²): 0.13 sr / 0.13 sr / 0.13 sr / - / 0.09 sr Solid angle (50 mm²): 0.24 sr / 0.28 sr / 0.23 sr / - / 0.09 sr Take-off angle (30 mm²): 25° / 25° / 25° / - / 20° Take-off angle (50 mm²): 22.3° / 24.1° / 25° / - / 20° MAG mode: x2,000 to 1,500,000 x 1,500 to 1,200,000 x1,200 to 1,000,000 x1,000 to 800,000 Low MAG: x50 to 6,000 x 50 to 2,000 SA MAG: x8,000 to 800,000 x6,000 to 600,000 x 5,000 to 600,000 x 5,000 to 400,000 SA diffraction: 80 to 2,000 mm, 100 to 2,500 mm, 150 to 3,000 mm HD: 4 to 80 m HR: 333 mm Minimum step size: 50 V Specimen tilting holder High tilt specimen retainer STEM5 Bright-field lattice: 0.2 nm Electron source: Schottky emitter: ZrO / W(100) Brightness: ≧4x10^-8 A / cm² / sr Pressure: 1x10^-8 Pa Probe: 0.5 nA for 1 nm Power Stability: AC Voltage: ≦1x10^-6 / min OL Current: ≦1x 10^-6 / min Modes: TEM: 2 to 5 nm, ７ to 30 nm EDS: 4 to 20 nm NBD: 0.5 to 2.4 nm CBD: 1.0 to 2.4 nm Parameters: Convergence angle: 1.5 to 20 mrad Acceptance angle: ±10° Specimen shift: X, Y-Axis: 2 mm, 2 mm, 2 mm, 2 mm, 2 mm Z-Axis: ±0.1 mm, ±0.2 mm, ±0.2 mm Specimen tilt: X / Y-Axis: ±25 / ±25°, ±35 / ±30°, ±42 / ±30°, ±15 / ±10°, ±38 / ±30° X-Axis: ±25°, ±80°, ±80°, ±80°, ±80° Power supply: 160 kV, 200 kV 2000 vintage.