二手 JEOL JEM 2100 #9185479 待售
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ID: 9185479
Analytical transmission electron microscope
Specimen anti-contamination trap
Point-to-point resolution: 0.25 nm (guaranteed by JEOL)
Observed Au (002) 0.2039nm, Si (022) 0.19194nm
Stage tilt angle: +/-30 degrees for X axis
Controller: Double tilt power supply
HXA Hard X-ray aperture
Retainer EM-21150 for low background EDX analysis
Free lens control
200kV
Modes:
TEM Microprobe
TEM Nanoprobe
STEM (Scanning transmission electron microscope)
OXFORD SDD Thin-window energy dispersive X-ray (EDS) detector
GATON Orius 1000 slow scan CCD camera
With 2k x 4k
Bright field (BF)
High-angle annular dark field (HAADF)
STEM Detectors: 35mm port
Objective pole piece
Capable of ±30° tilt
Cryo-sample holder: -183°C
Double-tilt: ±30° holder
Background (Be) EDS holders
Accelerating voltage:
Maximum accelerating voltage: 200 kV
Engineer alignments at 120kV, 200kV
Operator alignment at 80kV
Electron gun assembly:
LaB6
Spare wehnelt assembly
Spare DENKA filament – LKSH60SM3
Pole piece:
High tilt analytical pole piece (HRP20)
EM20720
Specimen holders take standard 3mm grid:
JEOL Single tilt
JEOL Tilting holder EM31630 +/-30 degrees for Y tilt axis
GATAN Cryoholder
Model: 636-J1622403N01HC
+/-30 Degrees for Y tilt axis faraday cup with heater
SATW Ultra-thin polymer window - window for detection of light elements
GATAN Double tilt holder (phosphor bronze):
Model: 646
+/-30 Degrees for Y tilt axis faraday cup
Double tilt power supply
TEM Mode:
Low mag: 50x - 6,000x
High mag: 2,000x - 1,500,000x
SA Mag: 8,000x - 800kx
Diffraction: 8cm - 200cm
MDS
Camera:
Orius SC1000 CCD camera: 4k x 2k
4008x2670 Pixels interline device
9um x 9um Pixel size
Binning 1x, 2x, 3x, 4x
Operating temperature = +10ºC
STEM Mode:
Mag & AMAG modes
Image resolution: 1.5 nm with HTP
Bright field STEM at 200 kV
Low mag: 100x to 15,000x
High mag: 20,000x to 2,000,000x
JEOL Bright field detector
JEOL High angle annular dark field (HAADF) detector
Rocking beam
Nano probe:
Alpha 1-5
Spot size 0.5nm-25nm
EDS:
Alpha 1-3
Spot size 0.5nm-25nm
CBED:
Alpha 1-9
Spot size 0.5nm-25nm
EDS Detector:
SDD 80 mm
Solid angle: 0.13sr
Resolution:
Mn Ka 127eV
F Ka 64eV
C Ka 56eV
Operating systems:
Windows XP for JEOL TEM PC
Windows XP for GATAN camera PC
Windows 7 for OXFORD EDX PC
KVMP Switch box for single wireless keyboard
Single wireless mouse control
Dual monitors
Missing part:
Gatan double tilt holder (be low background)
+/-30 Degrees for Y tilt axis faraday Cup
Double tilt power supply
Power:
240V/32A 50Hz main
All 240V PC run from JEOL transformer
TEM is 115V
Currently installed.
JEOL JEM 2100是一種掃描電子顯微鏡(SEM),徹底改變了電子顯微鏡的世界。它采用緊湊、節省空間的設計,使實驗室工作空間最大化。這種尖端儀器能夠產生高分辨率圖像,非常適合深入分析。顯微鏡具有30 kV的最大加速電壓和2 nA的電流速率,使其能夠拍攝其樣品的強大圖像。它還配備了用戶友好的軟件,使用戶更容易操作和動手培訓。JEM 2100以鎢絲、消色差物鏡和高精度槍控系統為特色。鎢絲發出的電子可以穿透樣品,並揭示光學顯微鏡通常看不到的細節。這些電子被消色差物鏡聚焦,然後通過槍支控制系統,將信號和圖像叠加。JEOL JEM 2100提供多種掃描模式,以滿足廣泛的需求。角度解析二次電子圖像(ARSEI)可用於分析樣品上非常小的特征和表面地形。此外,掃描電子顯微鏡和能量色散X射線光譜(SEM/EDS)選項可以用來識別樣品上的元素。這種先進的儀器甚至可用於自動化的工作場所生產線進行例行檢查,或用於研究實驗室進行批判性分析。JEM 2100還具有低噪聲成像系統、出色的真空性能以及精確集中樣品的高精度定位控制。JEOL JEM 2100是尋找先進可靠掃描電子顯微鏡者的終極選擇。從用戶友好的界面到強大的成像和數據收集能力,這款儀器非常適合需要市場上最好的電子顯微鏡的實驗室。
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