二手 JEOL JEM 2200FS #293587150 待售

製造商
JEOL
模型
JEM 2200FS
ID: 293587150
Transmission Electron Microscope (TEM) Performance parameters: FEG with ZrO/W(100) Schottky emitter Point resolution: 0.23 nm Line resolution: 0.10 nm 3-stage Intermediate lens system: 4-stage Projective: 2-stage Rotation-free imaging Innovative goniometer with 5-axis position control Piezo drive directions: X, Y Sample holder system with double O-Ring seal and ultra-clean high vacuum pump Cold trap Automatic heating system Sub-control systems: High voltage, goniometer, control panel Vibration damping type: Air mount Screenless operation via HDTV Camera system 1344 x 1024 pixels EM-FS: In-column filter system (4) Sector magnets Motor controlled 4-fold input panel Energy filtering: TEM, STEM Isochromaticity: <1 eV via 2k CCD Chip Geometric distortion: <1 % Detector resolution: used camera system Spectra CCD Camera, Film-negative Spectroscopy: Filter energy resolution: <0.15 eV EELS spectra speed: up to 50ms / Spektrum Dispersion detector level: 50-400u/eV (at 200 kV) GATAN UltraScan 1000 approx. 0.28-0.035 eV/pixel Readout speed: up to 10 spectra/sec Motor-controlled energy selection slot 702-70P-FEF: GATAN In-column filter Ratio map 704-00P: EELS analysis (704,00P) EM-20590: Electrode short voltages 200 kV EM-07320: Motorized lens hood for HR, HT, CR or HC pole shoe EM-20360: Motorized Hard X-Ray Aperture EDX analysis for UHR Polschuh JEM-2200FS: STEM Digital raster transmission unit EM-20670: Primary jet catcher EM-24580: Dark field imaging detector system, STEM EM-24630UH: Dark field imaging detector system STEM, EELS EM-21301: Piezoelement controlled 994.20P.2: GATAN UltraScan1000XP CCD Camera 2048 x 2048 pixels 100/200keV Specification: Sensor: 2048 x 2048 Pixels (à 14um) Full Frame CCD Scintillator: HCRTM Phosphor scintillator (P+) Coupling: HCRTM Fiber optics Binning: 1x, 2x, 4x, 8x Readout speed: 4.0Mpix/sec (4x1MHz) Frame Rate: 5fps at 4x binning, 512 x 512 pixels Digitization: 16Bit Readout noise: <20CCDe- at 1MHz MTF: 25% at 1/2 Nyquist (100kV), 17% at 12 Nyquist (200kV) Cooling temperature: < -24°C Camera head UltraScan camera housings TEM Adapter Post-Specimen shutter control lEEE1394b Computer interface IBM-Compatible computer system Fully motorized bezels TFT Monitor Operating system: Windows Power supply: 80, 100, 120, 160, 200 kV PC.
JEOL JEM 2200FS是一種創新的掃描電子顯微鏡(SEM),能夠產生高分辨率圖像和樣品的詳細分析。JEM的高效電子光學2200FS提供高質量的圖像,最終分辨率為1.2nm。高分辨率的二次成像和反向散射成像能力能夠精確和詳細地描述標本的原子水平特征。JEOL JEM 2200FS使用現場發射源,可確保高亮度和低噪聲水平。此外,探頭電流在1pA和10nA之間可調節,允許廣泛的成像應用。光束偏轉系統利用均勻的電磁場大小和廣泛的偏轉角度來校正任何試樣傾斜或漂移。光束掃描模式和操作控制在控制電子束參數方面提供了相當大的靈活性,從而實現了驚人的分辨率和高放大率成像。JEM 2200FS的標本室可以容納各種各樣的樣品,從常規樣品到3D物體甚至生物樣品。此外,該SEM還配備了一系列用於樣品制備的自動塗層系統。這一自動化過程可實現高度的一致性和可重復性,從而確保正確準備樣品進行分析。此外,JEOL JEM 2200FS支持多種信號探測器,包括二次電子探測器、反向散射電子探測器、信號電子探測器和能量色散X射線探測器。這些探測器設計用來捕捉樣品組成的精細細節,允許進行深入分析。總體而言,JEM 2200FS是最好的SEM之一。其出色的電子光學、先進的檢測能力、自動化塗層系統以及廣泛的性能特性使其成為各種成像和分析任務的理想選擇。
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