二手 JEOL JSM 6060 #293824714 待售
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ID: 293824714
Scanning Electron Microscope (SEM)
OXFORD INCA X-Act System, EDS
SEI Detector
Motorized stage
Chamber scope system
Magnification: 5x - 300000x
Specimen stage:
Fully automatic / Eucentric
Samples: 32 mm in diameter
Resolution:
High vacuum: 3.5 nm
Low vacuum: 4.0 nm
Acceleration voltage: 0.5 kV - 30 kV
Operating system: Windows XP.
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