二手 JEOL JSM 6335F #293751833 待售

製造商
JEOL
模型
JSM 6335F
ID: 293751833
Field Emission Scanning Electron Microscope (FE-SEM) SEI Detector Deben stage Magnification: 10x - 500000x Resolution: 15 kV: 1.5 nm (WD 4 mm) 1 kV: 5.0 nm (WD 4 mm).
還沒有評論