二手 JEOL JSM 6510 #9197947 待售

Scanning electron microscope (SEM) With OXFORD Inca EDS Resolution HV mode: 3.0 nm (30 kV), 8 nm (3 kV), 15 nm (1 kV) LV Mode: 4.0 nm (30 kV) Magnification: x 5 to x 300,000 (on 128 mm x 96 mm image size) 5-Step preset magnification Standard recipe Custom recipe: Operation conditions: Optics LV Pressure Specimen stage Image mode: Secondary electron image REF Image Composition Topography Shadowed Filament: Factory pre-centered filament Electron gun: Fully automated, manual override Condenser lens: Zoom condenser lens Objective lens: Super conical objective lens Objective lens apertures: (3) Stages, XY fine adjustable Stigmator memory Electrical image: Shift ± 50 μm (WD = 10 mm) Auto functions: Focus brightness contrast stigmator Specimen stage: Eucentric large-specimen stage X: 80 mm, Y: 40 mm, Z: 5 mm to 48 mm, Tilt: −10° to 90° Rotation: 360° Specimen exchange: Draw out the stage Maximum specimen: 150 mm Diameter PC: IBM PC/AT Compatible Operating system: Windows 7 Monitor: 19" LCD, 1 or 2*2 Frame store: 640 x 480, 1,280 x 960, 2,560 x 1,920, 5,120 x 3,340 Dual live image Full size image display Pseudo color Multi image display: (2) Images, (4) Images Digital zoom Dual magnification Network: Ethernet Measurement Image format: BMP, TIFF, JPEG Auto image archiving Pumping system: Fully automated, DP: 1, RP: 1 or 2*1 Switching vacuum mode: Through the menu LV Pressure: 10 to 270 Pa JED-2300 EDS*2 Principal options: Back scattered electron detector Low vacuum secondary electron detector Energy dispersive X-ray analyzer (EDS) Wave length dispersive X-ray analyzer (WDS) EBSD Stage navigation system Airlock chamber Chamber scope Operation keyboard LaB6 Electron gun Operation console: 750 mm wide, 900 mm wide Motor controlled stage: 2 Axes, 3 Axes, 5 Axes Accelerating voltage: 0.5 kV to 30 kV Currently installed.