二手 LEO / ZEISS Supra 40VP #293700639 待售

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ID: 293700639
Scanning Electron Microscope (SEM) OXFORD INSTRUMENTS Inca synergy 350 Energy Dispersive X-ray microanalysis system (EDS) HKL Premium Electron Backscatter Diffraction System (EBSD) LEICA Cryo stage components ZEISS / ATLAS 5 Array tomography package Voltage: 0.1-30 kV Detectors: SE2 Secondary electron In-lens SEM Scanning Transmission Electron Microscopy (STEM) Backscatter Detector (BSD) Variable pressure mode SE.
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