二手 PHILIPS / FEI Quanta 200 #9307654 待售
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已售出
ID: 9307654
優質的: 2003
Scanning Electron Microscope (SEM)
Tungsten source
Electron optics:
Thermal emission SEM column
With dual-anode source emission geometry
Fixed objective aperture and through lens differential pumping
Filament lifetime: > 100 Hours
Resolution:
High vacuum:
3.0 nm at 30 kV
4.0 nm at 30 kV
10 nm at 3 kV
Low vacuum:
3.0 nm at 30 kV
4.0 nm at 30 kV
<12 nm at 3 kV
Extended vacuum mode (ESEM): - 3.0 nm at 30 kV (SE)
Accelerating voltage: 200 V to 30 kV
Probe current: up to 2μA
Detectors:
Everhardt thornley SED
Low vacuum SED (LFD)
Gaseous SED (GSED)
IR-CCD
Solid state BSED
Vacuum chamber:
High vacuum: < 6e^-4 Pa
Low vacuum: 10 to 130 Pa
ESEM Vacuum: 10 to 2,600 Pa
Vacuum system:
240 l/s TMP, PVP
Lens differential pumping
Beam gas path length: 10 mm / 2 mm
Chamber:
Left to right: 284 mm
Analytical WD: 10 mm
(8) Ports
EDX Take-off angle: 35°
4-Axis motorized stage:
Eucentric goniometer stage
X, Y: 50 mm
Z: 50 mm (25mm motorized)
T: -15° to +75° (Manual)
R: 360° Continuous
Repeatability: 2 μm
System control:
32-Bit graphical user interface
With keyboard and optical mouse
Image display: 19" LCD, SVGA 1280 x 1024
Single frame / 4-Quadrants image display
4-Quadrants live
Quanta started training CD
Image processor:
Up to 4096 x 3536 pixels
File type: TIFF (8- /16-bit)
Standard utilities:
Digital video recording
Temperature control
Image histogram and measurement
System option:
PC and LCD, 19"
Monitor and DVD R/W
Multi-functional control panel
Controlled Pettier cooled
Specimen stage
Controlled 1000°C heating stage
Controlled 1500°C heating stage
Remote control
Video printer
Specimen holder kit
EDS
WDS
EBSD
Stray AC magnetic fields:
Asynchronous: < 100 nT
Synchronous: < 300 nT
Power consumption: < 2.0kVA for basic microscope
Temperature range: 15-30°C
Relative humidity: Below 80% RH
Door width: 90 cm
Operating system: Windows XP
No compressed air or water cooling
Power supply: 230V (+6%, -10%), 50/60 Hz (+/- 1%)
2003 vintage.
PHILIPS/FEI Quanta 200掃描電子顯微鏡(SEM)是一種高級成像工具,用於在非常高的放大倍率下評估表面和小物體的結構特性。利用內置的STEM探測器,可以對非導電樣品和導電樣品進行詳細分析。FEI Quanta 200配備了易於調節的雙鏡頭柱,使用戶能夠以各種放大倍數精確采樣各種樣品。它有一個先進的分析系統,用於高度詳細的圖像分析,如自動粒子大小分析和自動元素分析。它還利用先進的成像系統和一系列反向散射探測器,允許對亞微米樣品進行高分辨率成像。它具有一個柱內分析系統,可以檢測和計算樣品中的各種粒子和分子。飛利浦Quanta 200具有高性能電子光學元件,可實現更高分辨率的SEM成像。其高能電子槍產生高達200kV束電流,提供了極好的景深和圖像對比度。它還具有高角度放大功能,使用戶即使在某些高放大倍數下也能看到隱藏的結構或細節。Quanta 200配備了一個可以容納多種樣品類型的樣品支架,包括導電和非導電標本。它還具有一系列電極選項,包括冷卻級和溫度監視器。這樣可以更準確地檢測元素信息。PHILIPS/FEI Quanta 200設計方便用戶,它包括一個教程功能,可指導用戶完成成像和分析過程。FEI Quanta 200是一個非常好的成像工具,對於那些需要分析微小細節,甚至在極高放大倍率下識別隱藏特征或結構的人來說。這是一個可靠和高效的掃描電子顯微鏡,可以提供大量的詳細圖像和數據。這是完美的那些希望分析任何種類的樣品,從組件和零件到生物標本。
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