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ID: 293743760
Field Emission Gun Scanning Electron Microscope (FEG-SEM)
EDAS Microanalysis
Electron source: Schottky thermal field emitter
Modes: High and low vacuum (ESEM)
(3) Detectors:
EDAX
EDS
EBSD
Everhart-Thornley secondary electron
Variable pressure secondary electron
Backscattered electron
Infra-Red chamber scope.
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