二手 PHILIPS / FEI Quanta 400 #293585905 待售
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ID: 293585905
Scanning Electron Microscope (SEM)
Dispersive X-Ray detector
Ultra-thin detector window
Backscatter electron detector
USB controller:
DC-Isolated USB 2.0 Interface
HV-VAC Controller:
DAC Uni / Bipolar: ± 10 V (8 x 16 bit)
ADC for emission (5 x 10 bit)
VAC
Operating voltages
(16) Digital inputs and outputs
Security link to vacuum system
Control power supply
Turn-on of power supply
Emergency turn-off of electronics at malfunction
Module for deflection coils:
(2) Single deflection systems
(4) Double deflection systems
Magnification: 4 step and 16 bit
Scan rotation
Scan shift fine
Correction of tilt
Orthogonality
Rotation offset
Module with bipolar power supplies:
DAC for current/voltage supplies (8 x 16 bit)
Beam shift
Tilt coils
Image shift coils
Stigmator coils (8 pole)
Filament imaging
Stigmator image
Power supply: 4 x ±500 mA, 4 x ±10 V
Module for objective lens and condenser lenses:
Unipolar power supply
Objective lens: 2 x 16 bit DAC (coarse, fine), maximum 6.5 A
(2) Condenser lenses: 16 bit DAC, maximum 6.5 A
Image system:
Maximum pixels: 16384 x 16384
Pixel clock: 200 ns
D/A Converter for analog input signals (4 x 12 bit)
Counter for mapping (12 x 16 bit)
Simultaneous acquisition
(4) Analogs
(12) Digital input signals
Image acquisition
Windows 2000: Up to 10 (x86, x64)
Full screen mode
Slow scan
Mapping
Oversampling for noiseless images: Up to 32000
Line averaging
Frame averaging
Reduced area scan
ROI Scan
Qualitative and quantitative with EDS/WDS
AVI Function
Signal monitor to control image signals
Trigger inputs and clock outputs for point
Mains synchronization for slow scan
Thumbnail bar for acquired images
Image processing:
Image browser
Loading and saving of images file types: TIFF, BMP, JPEG, PNG, GIF
Auto save function
Creation of image sections
Image rotation
Image labeling functions
SEM Parameters
Power supply:
Analog power supplies: ±15 V, +5 V, +12 V
Switching power supply for high power objective and condenser lenses
Module for PMTs: 2 x 0 to 1.5 kV
Module for scintillator: 12 kV
Grid voltage: 0 V to 400 V.
PHILIPS/FEI Quanta 400，簡稱Q400，是一種掃描電子顯微鏡（SEM），設計用於材料表征和法醫分析。它具有一個場發射源-一個小的，局部電子源在SEM的心臟。這使儀器能夠在廣泛的樣品類型上收集高分辨率電子圖像、地圖和光譜。Q 400是固態系統，因此不需要液氮冷卻。該系統采用大型數字分辨率控制器，為樣品輸送精確的光束電流。對於成像,Q 400可以提供分辨率高達0.5nm的高對比度圖像,從而能夠準確確定表面地形。此外,它的SEM功能可用於通過EDS（能源色散光譜法）獲取化學映射信息,從而能夠在整個樣品表面快速進行元素映射。為了確保最佳的SEM成像和分析，樣品必須預制Q400提供的「標準虛擬」樣品支架。這有助於減少或消除對樣品的充電影響。利用膠體球體附著物可以研究表面之間的相互作用，使用測角儀可以收集晶體取向。在樣本表面下方，Q400可以通過收集一系列圖像來通過檢索更大的區域來探索局部表面結構。然後可以將它們合並並縫合在一起。這種縫合能力使研究人員能夠更詳細地探討更廣泛的結構和組成信息領域。捕獲SEM圖像和EDS映射常常會引發許多問題。例如，樣品的平均晶粒大小、微結構成分的大小和分布或任何其他形態或組成分析。Q 400支持許多可以回答這些問題的軟件程序。FEI Quanta 400是一種用途廣泛、可靠的掃描電子顯微鏡,具有多種功能,可用於從材料分析到法醫調查的廣泛應用。它的高分辨率成像、EDS映射、測角儀連接和表面成像能力使其領先於競爭對手。
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