二手 PHILIPS / FEI Titan #9315607 待售

System Electron sources: FEG Acceleration voltage range: 80 kV to 300 kV With preset alignment for 80 kV and 300 kV Scanning transmission electron microscopy mode Convergent beam and selected area electron diffraction modes Conventional TEM modes Point resolution in TEM mode: 0.20 nm at 300 kV Information limit: <0.1 nm STEM Resolution: 0.136 nm at 300 kV Super-twin objective lens pole piece FISCHIONE High angle annular dark field STEM detector for Z-contrast imaging BF and DF STEM detector GATAN Tridiem energy filter: Electron energy loss spectroscopy Energy-filtered TEM Filter energy spread: 0.8 eV Entrance aperture 5 mm EFTEM field of view: 20 μm (diagonal, select TEM models) Maximum diffraction angle: 120 mRad (select TEM models) Non-isochromaticity: < 1.25 eV Distortion: < 1.75 % Chromaticity: < 1.5 μm/eV Detector resolution: 2048 x 2048 pixels (UltraScan™ sensor with HCR™ technology) EFTEM readout speed: 4 frames/sec (EFTEM, 512 x 512) Viewing readout speed: > 10 frames/sec (Cinema mode, 512 x 256) Spectroscopy Filter energy resolution: 0.25 eV Attainable system resolution: 0.6 eV (0.55 eV TEM with cold FEG, 0.25 eV GIF) Detector channels per readout: 2,048 Detector dynamic range: 0 - 60,000 counts/ch Detector noise: < 6 counts/ch Maximum readout speed: > 30 spectra/sec 2K x 2K UltraScan camera No probe / Objective corrector EDX Ultimo max TLE silicon drift detector (100 mm²): Fast mapping: 200,000 Counts per second Energy peak resolution: Separate carbon Nitrogen Oxygen peaks with 50 eV FWHM.