二手 PERKIN ELMER Lambda 950 #9119552 待售

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ID: 9119552
Spectrometer P/N: L6020036 Lambda 950 STD Detector Assy Polarizer Assy-L900 Software: (UV Winlab 5.2.0 / Accessory software UV Winlab V1.1.3 / Software utilities Ver 7.00) Bandwidth: 0.05 nm - 5.00 nm in 0.01 nm increments UV/Vis range 0.20 nm - 20.00 nm in 0.04 nm increments NIR range Fixed resolution, constant energy or slit programming Light Source: Pre-aligned tungsten-halogen and deuterium Optics: Split Beam Photodetector: photomultiplier Photometric Range UV/Vis: 8 A NIR: 6 A Wavelength Range: 175 to 900 nm N2 purge required below 185 nm Power Requirements: 90 VAC - 250 VAC, 50/60 Hz; 250 VA Beam Splitting System: Chopper (46+ Hz, Cycle: Dark/Sample/ Dark/Reference, Chopper Segment Signal Correction) UV/Vis resolution: 2 A At 220 nm, 10 g/l NaI ASTM method: At 340 nm, 50 mg/l NaNO2 ASTM method: At 370 nm, 50 mg/l NaNO2 ASTM method: At 1420 nm, H20 1 cm path length: At 2365 nm, CHCl3 1 cm path length: Wavelength accuracy: UV/Vis: ± 0.080 nm NIR: ± 0.300 nm Wavelength reproducibility: UV/Vis (Deuterium lamp lines) NIR (Deuterium lamp lines) Standard deviation of 10 measurements UV/Vis Standard deviation of 10 measurements NIR Photometric accuracy: Double Aperture Method 1 A: ± 0.0006 A Double Aperture Method 0.5 A; ± 0.0003 A NIST 1930D Filters 2 A: ± 0.0030 A NIST 930D Filters 1 A: ± 0.0030 A NIST 930D Filters 0.5 A: ± 0.0020 A K2Cr2O7-Solution USP/DAP method: ± 0.0080 A Photometric linearity: Addition of filters UV/Vis at 546.1 nm, 2 nm slit, 1 second integration time At 1.0 A: ± 0.0060 A At 2.0 A: ± 0.0160 A At 3.0 A: ± 0.0050 A Photometric reproducibility Standard deviation for 10 measurements, 2 nm slit, 1 second integration time 1 A with NIST 930D Filter at 546.1 nm: = 0.00016 A 0.5 A with NIST 930D Filter at 546.1 nm: = 0.00008 A 0.3 A with NIST 930D Filter at 546.1 nm: = 0.00008 A Photometric display: Unlimited Photometric stability: After warm-up at 500 nm, 0 A, 2 nm slit, 2 second integration time, peak to peak: = 0.0002 A/h Baseline flatness: 190 nm - 3100 nm, 2 nm slit 0.20 second integration time UV/Vis, no smoothing applied 0.24 second integration time NIR, no smoothing applied: ± 0.0008 A Purging: Optics: Yes Sample compartment: Yes Light beam: 90 mm above the base plate 120 mm beam separation 3 mm - 12 mm beam height.
PERKIN ELMER Lambda 950是一款高精度分光光度計,在研究、質量分析和生產控制方面提供精確的紫外可見(UV-Vis)測量。它為最廣泛的應用提供了卓越的性能,並提供了滿足最苛刻的光譜分析要求的能力和靈活性。Lambda 950由具有大直徑光學元件的衍射光柵光學元件組成,可提供最佳的靈敏度和光譜分辨率水平。這使它能夠提供定性和定量應用所需的精確信息。它能夠測量190到950納米(nm),最多16個波長點用於全光譜掃描,或2個波長點用於更快的測量。它具有直觀、易於使用的接口,可直接連接到PC或筆記本電腦,從而易於使用和配置。軟件控制選項允許快速、準確的校準和數據采集。樣品對齊是自動化的,保證了高精度和準確性。自動縫隙尺寸選擇設施可實現最大分辨率,進一步提高測量精度。PERKIN ELMER Lambda 950還具有多項附加功能,例如用於遠程訪問的內置光纖、用於精確基於時間的測量的曝光計時器以及用於穩定讀數的溫度控制存儲模塊。它先進的光學、高靈敏度和高分辨率確保這種分光光度計在實驗室中提供最佳性能。
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