二手 VEECO / SLOAN DEKTAK 6M #9034870 待售
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ID: 9034870
晶圓大小: 6"
優質的: 2006
Surface profiler, up to 6"
Includes:
Step height repeatability
Low-inertia
Low-noise sensor (LIS 3)
High horizontal and vertical resolution
Uses a 12.5 micron diamond stylus
(2) Stylus tips
Reference thickness gauge
Vibration table
Programmable stylus (down to 1 mg)
Z-Height capability (up to 1 mm)
Up to 30,000 data points per scan
Windows software interface
Specifications:
Performance:
Sample stage diameter: 150 mm (6 in.)
Scan length range: 50 μm to 30 mm
X-Y stage translation: 20 mm x 80 mm
Theta sample positioning: 360°
Vertical data resolution: 1Å max. (@ 65 KÅ range)
Vertical range: 262 μm max. (1 mm optional)
Step height repeatability: 10 Å, 1σ
Data points per scan: 30,000 max.
Sample viewing: 2.6 mm FOV (2.6 mm to 0.5 mm FOV zoom option)
Stylus tip radius: 12.5 μm (std.)
Stylus force range: 1 mg to 15 mg (programmable adjustment)
Stylus sensor: LIS 3 (low-inertia sensor)
Stylus replacement: Quick-Change tool (std.)
System configuration:
Microprocessor: Intel Pentium III (monitor optional)
User interface: Microsoft Windows 98
Interface method: mouse/keyboard
Network card: enables exporting/printing data via local network
Power requirements: 115/220 VAC, 50/60 Hz, 5 A
Optional features:
Printer: color inkjet printer
Stress measurement: calculates tensile/compressive thin-film stress on wafers
Optional Styli: <1 μm to 25 μm radius tips (high-aspect-ratio tips & super-sharp 50 nm
radius tips also available)
Calibration standards: 200 Å to 10 μm step height standards (NIST traceable)
Vibration isolation table: isolates scan head from external noise
Zoom optics: 5 mm to 1 mm FOV
Ceramic vacuum chuck: for small samples
Extended range: increases vertical range to 1 mm
Step detection software: for calculating multiple step measurements
Monitor: 15-inch SVGA monitor or 15-inch flat panel w/stand
Environmental enclosure: Plexiglas shield protects scan head from dust
Standard analytical software:
Roughness parameters: Ra, Rq, Rp, Rv, Rt, Rz, max. Ra, max. dev., skew
Waviness parameters: Wa, Wq, WP, WV, Wt, max. dev.
Step height parameters: avg. step ht., avg. ht., max. peak, max. valley, max. ht.,
peak to valley, high spot count, peak count
Geometry parameters: area, slope, volume, radius, perimeter, bearing ratio
Programmable cutoff filter: conforms to ANSI B46.1
2006 vintage.
VEECO/SLOAN DEKTAK 6M是一種晶圓測試和計量設備,設計用於評估半導體制造過程中使用的晶圓的厚度和高度,以及用於其他應用。VEECO DEKTAK 6M是一種自動化的非接觸式旋轉電機測量系統,可掃描每秒1,400mm,可重復性為0.5 μ m。它配備了一個高度敏感的電容傳感器,它甚至可以測量晶圓表面最小的特征。該單元利用一個步驟並以恒定的速度重復,使用戶能夠快速掃描晶片以分析復雜的特征。SLOAN DEKTAK 6M還配備了自動調諧機,確保可靠的數據收集和處理。該工具可用於同時測量晶片的高度和厚度。DEKTAK 6M采用雙臂鎖定機構設計,確保晶圓在整個測量過程中保持在舞臺上,資產可以高速處理幾乎任何類型的材料。此外,VEECO/SLOAN DEKTAK 6M最多支持八個用戶定義的程序,這些程序可用於自定義測量過程和參數,例如速度、平均和結算時間。VEECO DEKTAK 6M還配備了強大的用戶界面,使研究人員能夠根據自己的需求定制模型。接口包括自動校準、圖形輸出以及測量數據的1-D或2-D繪圖。它還包括幾個數據分析程序,如比較多次掃描的能力,以及使用統計過程控制軟件分析數據的能力。總體而言,SLOAN DEKTAK 6M是一種優雅可靠的晶圓測試和計量設備,非常適合需要進行微觀測量的任何研究或生產需要。自動化和非接觸式系統可實現準確、可重復和可靠的測量,而操作員的參與卻很少。
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