二手 BRUKER NANOSTAR #9235860 待售
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ID: 9235860
優質的: 2013
Small Angle X-Ray Scattering (SAXS) system
Non-destructive: Investigation of 3 dimensional structures
Part number:
7KP28028MA
862-063701
862-842800
862-829400
PM1000
Part number: C79298A3158B46
Plug-in slit, 6 mm
Part number: 862-062201
Fe55 Calibration source
Part number: P5000110
Set of ten built-in nano particle models:
Basic geometrical models (Spherical, spherical shell, ellipsoidal, cylindrical)
Selected polymer models (Flexible and semi-flexible chains, gaussian star, spherical block copolymer micelle)
Tabletop:
(2) Stable granite tablets
Tabletop dimension: 3540 x 950 mm
Collimation system:
Diameters and distances:
Pinhole 1: 750 μm
Pinhole 2: 400 μm
Pinhole 3: 1000 μm
Distance pinhole 1 - Pinhole 2: 925 mm
Distance pinhole 2 - Pinhole 3: 485 mm
Copper anode
Power: 45 kV at 0.65 mA
Integrated MONTEL optics:
Length: 60 mm
Output divergence: 1 mrad
Output beam dimension: 0.64 mm
Output flux: 2 x 10^7 cps
Radiation tight housing with be-entrance and exit window enabling evacuation
(4) Manual setting screws
XL Sample chamber:
2-Dimensional VANTEC-2000 detector with mounting base
Beam path tube of 400 mm length with mounting base
Beam stop frame with two beam stops of 4.31 mm and 3.15 mm diameter
VANTEC-2000 Detector
True photon counting X-ray detector
Wide energy range: 4 keV up to 12 keV
Active area: 140 mm x 140 mm
Usable wavelength range: Cr-Ka to Cu-Ka (Factory set for Cu-Ka)
Energy resolution: <25 %
Operational mode:
2048 x 2048
1024 x 1024 / 512 x 512 Channels
Pixel size: 68 μm x 68 μm
Spatial resolution: < 100 μm RMS
Maximum global count rate: 10^6 cps
Maximum local count rate: 3 x 10³ cps/pixel
Background noise: < 5.0 10^-4 cps/mm²
Operational gas: Xe-CO2
Operating conditions:
Temperature: 15°C - 30°C
Humidity: Up to 80 % RH
Frame buffer:
Dedicated frame buffer PC
With proprietary parallel detector interface
Mouse and keyboard
Capacity of disk drives and CD-RW, DVD-ROM, hard disk
RAM: State of the art
User selectable frame display
Real color display of data
Graphical evaluation of one-dimensional data sets:
Display and comparison of measured and simulated data
Simple, interactive evaluation of SAXS measurements
Wide selection of commonly used axis scaling
Automatic fitting:
Different refinement methods for automatic evaluation:
Levenberg-Marquardt
Online display of intermediate results (Text and graphic)
Particle size distribution and change of c2 cost function
2013 vintage.
BRUKER NANOSTAR是X射線行業全球領先者BRUKER開發的X射線設備。它設計用於研究、工業和航空航天樣品的無損分析,提供內部和表面結構的納米尺度測量。NANOSTAR系統利用X射線源和檢測元件的獨特組合,使其即使在低劑量成像環境下也能獲得500納米分辨率的圖像。X射線源是一種高度聚焦的鈷-60光束,它精確地指向樣品,同時避開單元的其他組件。此功能確保了出色的樣品成像,並能夠以正確的劑量獲取詳細的圖像。BRUKER NANOSTAR機器還具有先進的數據收集、圖像處理和分析功能。可以多種格式獲取和存儲數據,從而實現快速數據分析。圖像處理工具可用於提高分辨率和對比度,使用戶能夠有效檢查納米尺度的特征。此外,內置分析工具可用於測量樣品的形狀、大小、孔隙度和其他特性。NANOSTAR X射線工具是對各種研究、工業和航空航天樣品進行無損分析的有力工具。高分辨率成像和強大的數據處理能力使我們能夠以微創的方式對復雜的樣品結構進行詳細的檢查和分析。BRUKER NANOSTAR資產以其獨特的X射線源和檢測組件組合,在X射線無損分析行業中處於領先地位。
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