二手 JEOL JEM 2010 #293741442 待售
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ID: 293741442
Transmission Electron Microscope (TEM)
Accelerating voltage: 200 kV
Point resolution: 0.19 nm
Equipped with 5-axis micro-active goniometer
LaB6
Double tilt holder
Single tilt holder
Chiller
Controller
HT Generator
PC
Table
Operating system: Windows XP
(2) Modes of operation:
Convergent Beam Diffraction (CBD) mode for crystal symmetry analysis
Nano Beam Diffraction (NBD) mode for crystal structure for nano-particles
GATAN CCD camera and Digital Micrograph provides:
Improved lattice-resolution
Automated measurement capabilities
Real-time video recording.
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