6
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過濾器
6 結果
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(5)
JEOL
JEM 2010
Transmission Electron Microscope (TEM) Accelerating voltage: 200 kV Point resolution: 0.19 nm Equipp
7
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熱門產品
JEOL
JEM 2010
Transmission Electron Microscope (TEM) Thermal cathode (Tungsten, Denka LaB6) Cold trap Camera side
40
熱門產品
JEOL
JEM 2010
Transmission Electron Microscope (TEM) Hard Disk Drive (HDD) has been removed.
181
熱門產品
JEOL
JEM 2010
Transmission Electron Microscope (TEM) LaB6 Source Analytical pole piece: 0.23 nm STEM Detector No c
268