二手 JEOL JSM 6340F #9076781 待售
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ID: 9076781
優質的: 1998
FE Scanning Electron Microscope (FE-SEM)
BSE Capability
Noise canceler: Detector
Grounding terminal: 1,100 Ω or less
Pump:
Ion pumps
Oil rotary pump
Oil diffusion pump
Secondary electron image resolution:
15 kV: 1.2 nm
1 kV: 2.5 nm
Magnification
LM Mode: 25x to 2,000x Zoom mode (MAG)
HR Mode: 500x to 650,000x (WD 8 mm)
Electric optical system:
Electron gun
Type: Cold-cathode field emission
Accelerating voltage: 0.5 to 30 kV
0.5 to 2.9 kV Variable in 0.01 kV steps
2.9 to 30 kV Variable in 0.1 kV steps
Emission current: 4,8,12 µA
Alignment:
Mechanical horizontal shift
Electromagnetic deflection
Lens system:
Condenser lens:
(2) Stages
Electromagnetic
Zooming system
Aperture angle Control Lens (ACL): Electromagnetic lens
Electron Optical System (EOS) Operating modes
Image scanning:
High Resolution (HR)
Low Magnification (LM)
Alignment patterns (ALP)
Focusable working distance: 2 to 25 mm
Automatic focus:
Image rotation compensator
Dynamic focus:
Objective lens apertures: 50, 70, 70, 110 µm in Diameter
Stigmators
Wobbler
Specimen stage
Type: Fully eucentric goniometer stage
Specimen movement range
X-Direction: 0-50 mm
Y-Direction: 0-70 mm
Z-Direction: 2, 3, 6, 8, 15 and 25 mm (Step wise change)
Tilt: -5°C to 45°C
Rotation: 360°C Endless
Working distances: 2, 3, 6, 8, 15 and 25 mm
Electron detector system:
Detector
Photo multiplier voltage
Video amplifier control
Contrast control
Brightness control
Back scattered electron detector:
Imaging modes
Detector
Operation and display system
Image data processing system
Keyboard control
Photographic recording system
Scaler
Vacuum system
Safety devices
Cooling water:
Flow rate: 3 R. l/min or higher
Pressure: 0.05 to 0.25 MPa
Temperature: 20 ± 5°C
Faucet: 1, ISO 7/1 Rc 1/4 Coupling / 1, 14 mm 0.0. Nozzle
Drain: 1, ISO 711 Rc 1/4 Coupling / 1, Larger than 25 mm I.D. Nozzle
Sample size: Maximum, 4"
X-Direction: 50 mm
Y-Direction: 70 mm
Chamber:
Airlock, 4"
LN2 Cold trap, 4"
No EDX
Operating system: Windows 2000
Power supply: 200 V, 50/60 Hz, Single phase, 6 kVA
1998 vintage.
JEOL JSM 6340F是一種最先進的掃描電子顯微鏡（SEM）。它配備了一個納米聚焦電子束柱，以及用於成像、分析和材料表征的多種特征。SEM旨在生成任何樣品表面的清晰圖像,無論其大小或復雜性如何。JEOL JSM-6340F配備了LaB6電子槍，產生能量高、散度低的電子。這使得電子束的精確聚焦能夠創建即使是最小特征的銳利圖像。該儀器還配備了先進的阻尼技術，可減少成像過程中的漂移和振動，確保準確性並消除偽影。SEM具有高靈敏度的閃爍體和移光片，能夠以更高的放大倍率和分辨率成像。這樣可以改進對組成和結構信息的檢測。顯微鏡還具有一個索引設備，以便更快和更容易操作。該自動對準系統保證了光束的可靠和可重復對準。這樣就不需要手動調整光束,從而大大節省了時間並提高了潛在的分辨率。JSM 6340 F的其他特性包括高速樣本掃描單元、自動控制機和集成數字信號處理器。自動控制工具維持顯微鏡腔室的精確溫度和濕度，為操作創造穩定的環境。集成數字信號處理器還允許高效的數據處理和圖像分辨率。JEOL JSM 6340 F是需要最高精度和分辨率的應用的理想掃描電子顯微鏡。廣泛的選擇和功能使得這種最先進的顯微鏡幾乎適合任何SEM成像應用。
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