二手 ASML XT 760F #9237243 待售
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ID: 9237243
晶圓大小: 12"
優質的: 2006
DUV Scanner, 12"
Locking kit
TAMIS (EMTA):
Z7 Offset: ±4.0 nm (-5.96)
Z8 Offset: ±4.0 nm (-1.11)
Z7 Tilt in X: ±2.0 nm/cm (-0.04)
Z9 Offset: ±4.0 nm (0.48)
SAMOS (EMCA):
SAMOS: ≤3% (1.74)
SLIT Uniformity (LUSU):
- / NA / S.In / S.Out / Control spec / Down spec / Result
Annular (M-Action) / 0.7 / 0.55 / 0.85 / 1.50% / 3.00% / 0.31
Conventional / 0.65 / 0 / 0.75 / 1.50% / 3.00% / 0.26
Conventional / 0.7 / 0 / 0.6 / 1.50% / 3.00% / 0.28
Model result parameter:
Best focus: ±0.015 (0.002)
Image height C1 (um): 0 ±0.015 (0.002)
Image height C2 (um): 0 ±0.015
Image height different (um): 0 ±0.015
Image tilt ry C1 (urad): 0 ±0.5 (-0.279)
Image tilt ry C2 (urad): 0 ±0.5
Image tiltry different (urad): 0 ±0.5
Intrafield:
Focus range chuck 1 Before: <120 nm (91.6)
Focus range chuck 2 Before: <120 nm
Focus range chuck 1 After: <120 nm (89)
Focus range chuck 2 After: <120 nm
Focus range C1 different (nm): 0 +15 (2.6)
Focus range C2 different (nm): 0 +15
Astigmatism range C1 different (nm): 0 ±5 (0.6)
Astigmatism range C2 different (nm): 0 ±5
Result after correction:
IPD Mean (nm): <120 (89)
IPD STDEV (nm): <10
Astigmatism mean (nm): <70 (36)
Astigmatism STDEV (nm): <10
Dose accuracy and repeatability performance (ODAR):
Dose accuracy: <2.0 (max) (1.416)
Dose repeatability: <0.5 (0.057)
CARL ZEISS SMT Lens
Charcoal filter
External interface module
Bottom module
Reticle stage
Covering panels frame parts
Covering panels frame MCAB
Covering panels
RSRC Cabinet
MCWC Cabinet
MDC Cabinet
LCWC Cabinet
Exhaust cabinet
Machine parts clean folder
Side channel blower
(6) Machine parts
Double stage
CYMER Laser not included.
ASML XT 760F是一種晶圓步進工具,設計用於集成電路生產中的光刻應用。它提供高分辨率和均勻性,與其他傳統的光學晶片步進器相比,允許精確、可重復的成像。ASML XT:760F配備了專有的運動學運動設備,能夠產生極其精確和平滑的運動來定位鏡片和鏡子。該運動系統的設計具有最大的精度和最小的橫向級漂移值,能夠在高頻下工作,以實現穩定和可重復的成像過程。它還配備了兩軸Pololu機器人執行器,專門為光刻應用中的精確運動而設計。XT 760 F利用高性能的數字檢振掃描儀進行成像。此掃描儀的設計目的是提供穩定的成像過程,同時確保掃描儀鏡像在X、Y和Z軸上的高精度移動。這款掃描儀還配備了能夠實現高分辨率成像的光束成形模塊。隨附的軟件模塊和硬件功能可方便準確地控制和調整掃描儀。XT:760F配有高分辨率CCD照相機,設計用於在光刻完成後捕捉晶片的圖像,以便測量IC的表面特征。相機還配備了先進的圖像處理算法,旨在降低噪音,增強圖像對比度。此外,相機裝置被設計用來捕捉低熱量噪聲的圖像,提供穩定的成像環境。XT 760F是一種高度自動化的晶圓步進器,可實現可靠和可重復的成像。它能夠以高達25 nm的分辨率成像,曝光時間僅為幾秒鐘。該機器能夠在晶片上實現一致的圖像均勻性以及跨晶片的可靠重復性。此外,它是高效的,提供了多個晶片的同時成像。這樣可以在保持高精度和高精度的同時實現最大吞吐量。
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