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PHILIPS / FEI Altura 855 #9329323

PHILIPS / FEI

Altura 855

Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Sample holder, 6" Piece holder load lock ent
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PHILIPS / FEI Altura 855 #293754986

PHILIPS / FEI

Altura 855

Focused Ion Beam Scanning Electron Microscope (FIB-SEM).
24