14
發現的結果
過濾器
全部清除
過濾器
14 結果
晶圓大小
-
(8)
優質的
-
(1)
-
(6)
-
(3)
-
(1)
-
(11)
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TERADYNE
J973
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Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
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Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
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Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
93
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Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
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Test System J973-400AP VLSI Test System Includes: - Mainframe for channels 1-512 at 150ps edge
140