15
發現的結果
過濾器
全部清除
過濾器
15 結果
晶圓大小
-
(8)
優質的
-
(1)
-
(6)
-
(3)
-
(1)
-
(12)
TERADYNE
J973
Testers Tester Computer: Sun ultra 2 383 Pins AXF 0: DC PWR AXF SLOT 1: MAC FAN AXF SLOT 6: PMU AXF
2
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熱門產品
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
161
熱門產品
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
136
熱門產品
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
145
熱門產品
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
186
熱門產品
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
155
熱門產品
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
160
熱門產品
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
163
熱門產品
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
167
熱門產品
TERADYNE
J973
Test System J973-400AP VLSI Test System Includes: - Mainframe for channels 1-512 at 150ps edge
227
