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FEI Expida 1265 #9314991
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FEI

Expida 1265

Dual beam Focused Ion Beam (FIB) system, 12" TEM lamella preparation SEM Resolution: 5-7 nm Defect a
217
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FEI Expida 1265 #9194878
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FEI

Expida 1265

Dual beam FIB, 12" Electron beam image resolution: 3 nm-5 nm Beam voltage: 1-30 kV Ion beam resolut
217
FEI Expida 1265 #9228102
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FEI

Expida 1265

Dual beam FIB system, 12".
173
FEI Expida 1265 #9243139
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FEI

Expida 1265

Dual beam FIB system, parts machine.
175
FEI Expida 1265 #9210949
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FEI

Expida 1265

System.
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