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FEI Expida 1265 #9314991
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FEI

Expida 1265

Dual beam Focused Ion Beam (FIB) system, 12" TEM lamella preparation SEM Resolution: 5-7 nm Defect a
101
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FEI Expida 1265 #9194878
熱門產品

FEI

Expida 1265

Dual beam FIB, 12" Electron beam image resolution: 3 nm-5 nm Beam voltage: 1-30 kV Ion beam resolut
106
FEI Expida 1265 #9228102
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FEI

Expida 1265

Dual beam FIB system, 12".
82
FEI Expida 1265 #9243139
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FEI

Expida 1265

Dual beam FIB system, parts machine.
87
FEI Expida 1265 #9210949
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FEI

Expida 1265

System.
108