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JSM 6490LV
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JEOL JSM 6490LV #293682531

JEOL

JSM 6490LV

Scanning Electron Microscope (SEM) Infrared camera Detectors: Secondary Electron (SE) Backscattered
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JEOL JSM 6490LV #9278879

JEOL

JSM 6490LV

Scanning Electron Microscope (SEM) Resolution: 3.0 nm Includes: (2) CPU (3) APC Back-ups KEITHLEY 4
296
JEOL JSM 6490LV #9229495

JEOL

JSM 6490LV

Scanning Electron Microscope (SEM) Low vacuum mode High resolution: 3.0 nm With motor stage Asynchro
229
JEOL JSM 6490LV #293594823

JEOL

JSM 6490LV

Scanning Electron Microscope (SEM) Magnification: 8x to 300,000x Image mode: SEI, BEI, Low vacuum BE
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