二手JEOL JSM 6490LV待售

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JEOL

模型

JSM 6490LV

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4 發現的結果

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4 結果

Scanning Electron Microscope (SEM) Infrared camera Detectors: Secondary Electron (SE) Backscattered

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熱門產品

Scanning Electron Microscope (SEM) Resolution: 3.0 nm Includes: (2) CPU (3) APC Back-ups KEITHLEY 4

209

熱門產品

Scanning Electron Microscope (SEM) Low vacuum mode High resolution: 3.0 nm With motor stage Asynchro

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熱門產品

Scanning Electron Microscope (SEM) Magnification: 8x to 300,000x Image mode: SEI, BEI, Low vacuum BE

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