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熱門產品
AMAT / APPLIED MATERIALS
NANOSEM 3D
Critical Dimension Scanning Electron Microscope (CD SEM), 12" Install type: Stand alone (3) Cassette
280
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熱門產品
AMAT / APPLIED MATERIALS
NANOSEM 3D
Automated CD metrology system, 8" Wafer shape: SNNF (Semi Notch No Flat) Wafer cassette: PP Miraial,
230
熱門產品
AMAT / APPLIED MATERIALS
NANOSEM 3D
Critical Dimension Scanning Electron Microscope (CD-SEM).
31
熱門產品
AMAT / APPLIED MATERIALS
NANOSEM 3D
Critical Dimension Scanning Electron Microscopes (CD-SEM).
265
熱門產品
AMAT / APPLIED MATERIALS
NANOSEM 3D
Critical Dimension Scanning Electron Microscope (CD-SEM).
258
熱門產品
AMAT / APPLIED MATERIALS
NANOSEM 3D
Scanning Electron Microscopes (CD SEM), 12" 2004 vintage.
231
熱門產品
AMAT / APPLIED MATERIALS
NANOSEM 3D
Scanning Electron Microscopes (CD SEM), 12" 2004 vintage.
207
熱門產品
AMAT / APPLIED MATERIALS
NANOSEM 3D
Critical Dimension Scanning Electron Microscope (CD-SEM), 12" 2002 vintage.
225
