二手KLA / TENCOR 6420 Surfscan待售

晶圓測試和計量

製造商

KLA / TENCOR

模型

6420 Surfscan

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5 發現的結果

過濾器

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5 結果

熱門產品

Particle inspection system, 2"-8" Substrate thickness: 12 mm Single puck handling from single casset

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熱門產品

Non-patterned surface inspection system, 4"-8" Defect sensitivity: 0.12 micron at 95% capture Haze s

熱門產品

Non-patterned wafer film surface analyzer, 6" Automatic wafer handler Defect map and Histogram 2D Si

熱門產品

Defect inspection system, 6" Upgraded from 6220.

熱門產品

Non-patterned surface inspection system, 4"-8" Defect sensitivity: 0.12 microns Haze sensitivity: 0.